Reflectance properties of silicon moth-eyes in response to variations in angle of incidence, polarisation and azimuth orientation
Reflectance properties of silicon moth-eyes in response to variations in angle of incidence, polarisation and azimuth orientation
We report a study of the optical properties of silicon moth-eye structures using a custom-made fully automated broadband spectroscopic reflectometry system (goniometer). This measurement system is able to measure specular reflectance as a function of wavelength, polar incidence angle and azimuth orientation angle, from normal to near-parallel polar incidence angle. The system uses a linear polarized broadband super-continuum laser light source. It is shown that a moth-eye structure composed of a regular array of protruding silicon rods, with finite sidewall angle reduces reflectance and sensitivity to incident wavelength in comparison to truly cylindrical rods with perpendicular sidewalls. It is also shown that moth-eye structures have omnidirectional reflectance properties in response to azimuth orientation of the sample. The importance of applying the reflectometer setup to study the optical properties of solar cell antireflective structures is highlighted.
a402-a415
Asadollahbaik, Asa
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Boden, Stuart
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Charlton, M.D.B.
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Payne, D.N.R.
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Cox, S.J.
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Bagnall, D.M.
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18 February 2014
Asadollahbaik, Asa
af3047e2-2925-44c5-8d8b-7cb12a1146ee
Boden, Stuart
83976b65-e90f-42d1-9a01-fe9cfc571bf8
Charlton, M.D.B.
fcf86ab0-8f34-411a-b576-4f684e51e274
Payne, D.N.R.
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Cox, S.J.
0e62aaed-24ad-4a74-b996-f606e40e5c55
Bagnall, D.M.
5d84abc8-77e5-43f7-97cb-e28533f25ef1
Asadollahbaik, Asa, Boden, Stuart, Charlton, M.D.B., Payne, D.N.R., Cox, S.J. and Bagnall, D.M.
(2014)
Reflectance properties of silicon moth-eyes in response to variations in angle of incidence, polarisation and azimuth orientation.
Optics Express, 22 (S2), .
(doi:10.1364/OE.22.00A402).
Abstract
We report a study of the optical properties of silicon moth-eye structures using a custom-made fully automated broadband spectroscopic reflectometry system (goniometer). This measurement system is able to measure specular reflectance as a function of wavelength, polar incidence angle and azimuth orientation angle, from normal to near-parallel polar incidence angle. The system uses a linear polarized broadband super-continuum laser light source. It is shown that a moth-eye structure composed of a regular array of protruding silicon rods, with finite sidewall angle reduces reflectance and sensitivity to incident wavelength in comparison to truly cylindrical rods with perpendicular sidewalls. It is also shown that moth-eye structures have omnidirectional reflectance properties in response to azimuth orientation of the sample. The importance of applying the reflectometer setup to study the optical properties of solar cell antireflective structures is highlighted.
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Accepted/In Press date: 9 February 2014
e-pub ahead of print date: 18 February 2014
Published date: 18 February 2014
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 362747
URI: http://eprints.soton.ac.uk/id/eprint/362747
ISSN: 1094-4087
PURE UUID: 6e9ebfbd-52a6-426a-a3d7-47a908ce413e
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Date deposited: 05 Mar 2014 17:27
Last modified: 15 Mar 2024 03:21
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Contributors
Author:
Asa Asadollahbaik
Author:
Stuart Boden
Author:
M.D.B. Charlton
Author:
D.N.R. Payne
Author:
D.M. Bagnall
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