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Erasable diffractive grating couplers in silicon on insulator for wafer scale testing

Erasable diffractive grating couplers in silicon on insulator for wafer scale testing
Erasable diffractive grating couplers in silicon on insulator for wafer scale testing
Unlike electronic integrated circuits, robust systems are not widely available for effectively testing optical integrated circuits at intermediate points on a waveguide, without introducing substantial losses into the devices. This makes quality control difficult, only the output of the entire optical circuit can be observed; providing complete system information, rather than localising a problem. A benefit of the Silicon on Insulator platform is its low cost; however processed silicon quickly becomes expensive. Each processing step costs money, testing is critical to reducing costs and increasing production yield. Here we report a method for more complete testing of optical circuits.
Topley, R.P.
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Martinez-Jimenez, G.
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O'Faolain, L.
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Healy, N.
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Mailis, S.
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Thomson, D.J.
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Gardes, F.Y.
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Peacock, A.C.
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Payne, D.N.R.
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Mashanovich, G.Z.
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Reed, G.T.
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Topley, R.P.
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Martinez-Jimenez, G.
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O'Faolain, L.
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Healy, N.
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Mailis, S.
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Thomson, D.J.
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Gardes, F.Y.
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Peacock, A.C.
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Payne, D.N.R.
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Mashanovich, G.Z.
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Reed, G.T.
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Topley, R.P., Martinez-Jimenez, G., O'Faolain, L., Healy, N., Mailis, S., Thomson, D.J., Gardes, F.Y., Peacock, A.C., Payne, D.N.R., Mashanovich, G.Z. and Reed, G.T. (2014) Erasable diffractive grating couplers in silicon on insulator for wafer scale testing. SPIE Photonics West 2014, San Francisco, United States. 01 - 06 Feb 2014. 8 pp . (doi:10.1117/12.2039179).

Record type: Conference or Workshop Item (Paper)

Abstract

Unlike electronic integrated circuits, robust systems are not widely available for effectively testing optical integrated circuits at intermediate points on a waveguide, without introducing substantial losses into the devices. This makes quality control difficult, only the output of the entire optical circuit can be observed; providing complete system information, rather than localising a problem. A benefit of the Silicon on Insulator platform is its low cost; however processed silicon quickly becomes expensive. Each processing step costs money, testing is critical to reducing costs and increasing production yield. Here we report a method for more complete testing of optical circuits.

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Erasable diffractive grating couplers in silicon on insulator for wafer scale testing - Other
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More information

Published date: 2014
Additional Information: 8990-7
Venue - Dates: SPIE Photonics West 2014, San Francisco, United States, 2014-02-01 - 2014-02-06
Organisations: Optoelectronics Research Centre

Identifiers

Local EPrints ID: 363115
URI: https://eprints.soton.ac.uk/id/eprint/363115
PURE UUID: 257bae23-0240-43c9-b207-e60ffd488fe0
ORCID for S. Mailis: ORCID iD orcid.org/0000-0001-8100-2670
ORCID for A.C. Peacock: ORCID iD orcid.org/0000-0002-1940-7172

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Date deposited: 20 Mar 2014 15:31
Last modified: 02 Oct 2019 00:37

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Contributors

Author: R.P. Topley
Author: G. Martinez-Jimenez
Author: L. O'Faolain
Author: N. Healy
Author: S. Mailis ORCID iD
Author: D.J. Thomson
Author: F.Y. Gardes
Author: A.C. Peacock ORCID iD
Author: D.N.R. Payne
Author: G.T. Reed

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