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Electrical fatigue-induced cracking in lead zirconate titanate piezoelectric ceramic and its influence quantitatively analyzed by refatigue method

Electrical fatigue-induced cracking in lead zirconate titanate piezoelectric ceramic and its influence quantitatively analyzed by refatigue method
Electrical fatigue-induced cracking in lead zirconate titanate piezoelectric ceramic and its influence quantitatively analyzed by refatigue method
Lead zirconate titanate (PZT) is one of the most commonly used piezoelectric ceramics. The major causes of its electrical fatigue are suggested to be domain pinning and cracking. However, their contributions to fatigue have never been quantitatively compared. This study focuses on the electrical fatigue-induced microstructure damage in the near-electrode regions of PZT and uses a refatigue method to determine quantitatively the contribution of the cracking mechanism to electrical fatigue. It is shown that during bipolar electrical cycling, a large number of cracks are initiated in the samples, and the cracking is particularly concentrated in the near-electrode regions. So the loss of piezoelectric properties can be partially restored by removing such regions. For a particular fatigue stage, the cracking mechanism contributes significantly more to the electrical fatigue than the domain pinning mechanism.
0002-7820
2593-2600
Luo, Zhenhua
eb242e50-a73e-474f-809f-4924cfed68c2
Pojprapai, Soodkhet
19da0711-ccd8-44c7-8499-b19e3caf1956
Glaum, Julia
9ae13470-db2e-41b6-a2ba-59a0b7bd5cae
Hoffman, Mark
1d549729-a5d6-4241-a467-cac304447980
Luo, Zhenhua
eb242e50-a73e-474f-809f-4924cfed68c2
Pojprapai, Soodkhet
19da0711-ccd8-44c7-8499-b19e3caf1956
Glaum, Julia
9ae13470-db2e-41b6-a2ba-59a0b7bd5cae
Hoffman, Mark
1d549729-a5d6-4241-a467-cac304447980

Luo, Zhenhua, Pojprapai, Soodkhet, Glaum, Julia and Hoffman, Mark (2012) Electrical fatigue-induced cracking in lead zirconate titanate piezoelectric ceramic and its influence quantitatively analyzed by refatigue method. Journal of the American Ceramic Society, 95 (8), 2593-2600. (doi:10.1111/j.1551-2916.2012.05232.x).

Record type: Article

Abstract

Lead zirconate titanate (PZT) is one of the most commonly used piezoelectric ceramics. The major causes of its electrical fatigue are suggested to be domain pinning and cracking. However, their contributions to fatigue have never been quantitatively compared. This study focuses on the electrical fatigue-induced microstructure damage in the near-electrode regions of PZT and uses a refatigue method to determine quantitatively the contribution of the cracking mechanism to electrical fatigue. It is shown that during bipolar electrical cycling, a large number of cracks are initiated in the samples, and the cracking is particularly concentrated in the near-electrode regions. So the loss of piezoelectric properties can be partially restored by removing such regions. For a particular fatigue stage, the cracking mechanism contributes significantly more to the electrical fatigue than the domain pinning mechanism.

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Published date: 2012
Organisations: Electronics & Computer Science

Identifiers

Local EPrints ID: 364510
URI: http://eprints.soton.ac.uk/id/eprint/364510
ISSN: 0002-7820
PURE UUID: 38a08628-96ff-4d2a-a781-24f8462e0bfb
ORCID for Zhenhua Luo: ORCID iD orcid.org/0000-0003-0766-6174

Catalogue record

Date deposited: 02 May 2014 09:34
Last modified: 26 Nov 2019 01:34

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