An asperity-based finite element model for electrical contact of microswitches
An asperity-based finite element model for electrical contact of microswitches
Precise prediction of electrical contact resistance is important for microswitches. The contact spot used to beconsidered as a circle in earlier literature, where there was only one geometrical parameter: the radius of the a-spots. However, a real contact asperity has a height and an angle with the interface. In this paper, a 3-dimensional cone-truncated geometry is used to model an asperity, and three parameters are defined: radius, height and the angle of the side with respect to the surface plane. The ranges of their values are extracted from AFM measurement of samples in Au and Ru, and the values match well with the previous mechanical simulation results
978-1-4799-1556-9
1-10
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38
Pons, Patrick
c6126310-1cb0-471a-a6e0-f0038785051b
Colin, Stephane
4045afbc-754d-4ec2-ba09-2575f83a3ac7
September 2013
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38
Pons, Patrick
c6126310-1cb0-471a-a6e0-f0038785051b
Colin, Stephane
4045afbc-754d-4ec2-ba09-2575f83a3ac7
Liu, Hong, Leray, Dimitri, Pons, Patrick and Colin, Stephane
(2013)
An asperity-based finite element model for electrical contact of microswitches.
IEEE 59th Holm Conference on Electrical Contacts (HOLM 2013), Newport, United States.
22 - 25 Sep 2013.
.
(doi:10.1109/HOLM.2013.6651398).
Record type:
Conference or Workshop Item
(Paper)
Abstract
Precise prediction of electrical contact resistance is important for microswitches. The contact spot used to beconsidered as a circle in earlier literature, where there was only one geometrical parameter: the radius of the a-spots. However, a real contact asperity has a height and an angle with the interface. In this paper, a 3-dimensional cone-truncated geometry is used to model an asperity, and three parameters are defined: radius, height and the angle of the side with respect to the surface plane. The ranges of their values are extracted from AFM measurement of samples in Au and Ru, and the values match well with the previous mechanical simulation results
Text
Holm2013_LH.pdf
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Published date: September 2013
Venue - Dates:
IEEE 59th Holm Conference on Electrical Contacts (HOLM 2013), Newport, United States, 2013-09-22 - 2013-09-25
Organisations:
Mechatronics, Engineering Science Unit
Identifiers
Local EPrints ID: 368140
URI: http://eprints.soton.ac.uk/id/eprint/368140
ISBN: 978-1-4799-1556-9
PURE UUID: b79b261b-203b-4701-9393-c318ac45925e
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Date deposited: 22 Sep 2014 08:32
Last modified: 14 Mar 2024 17:42
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Contributors
Author:
Hong Liu
Author:
Dimitri Leray
Author:
Patrick Pons
Author:
Stephane Colin
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