Clock faults induced min and max delay violations
Clock faults induced min and max delay violations
In this paper, we show that clock faults producing duty-cycle variations, which have been proven very likely, can give rise to min or max delay violations. This mandates new, specific testing approaches for clock faults, to avoid them to compromise the system correct operation in the field, with dramatic effects on product quality and defect level. We then introduce a new scheme that can be employed to detect the clock faults causing duty-cycle variations.
111-123
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Cazeaux, Jose' Manuel
de02151c-4f59-4686-a730-18f78d372562
Mak, T.M.
452aaf4a-4fae-426b-92cc-b8437998d3e3
February 2014
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Cazeaux, Jose' Manuel
de02151c-4f59-4686-a730-18f78d372562
Mak, T.M.
452aaf4a-4fae-426b-92cc-b8437998d3e3
Rossi, Daniele, Omana, Martin, Cazeaux, Jose' Manuel and Mak, T.M.
(2014)
Clock faults induced min and max delay violations.
Journal of Electronic Testing, 30 (1), .
(doi:10.1007/s10836-013-5426-4).
Abstract
In this paper, we show that clock faults producing duty-cycle variations, which have been proven very likely, can give rise to min or max delay violations. This mandates new, specific testing approaches for clock faults, to avoid them to compromise the system correct operation in the field, with dramatic effects on product quality and defect level. We then introduce a new scheme that can be employed to detect the clock faults causing duty-cycle variations.
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Published date: February 2014
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368665
URI: http://eprints.soton.ac.uk/id/eprint/368665
ISSN: 0923-8174
PURE UUID: e684fa28-abe6-4567-b7a7-e2c3c7090843
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Date deposited: 09 Sep 2014 09:59
Last modified: 14 Mar 2024 17:51
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Contributors
Author:
Daniele Rossi
Author:
Martin Omana
Author:
Jose' Manuel Cazeaux
Author:
T.M. Mak
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