Rossi, Daniele, Van Dijk, V.E.S., Kleihorst, Richard, Nieuwland, Andre' and Metra, Cecilia (2003) Power consumption of fault tolerant codes: the active elements. 9th IEEE International On-Line Testing Symposium, Kos Island, Greece. 07 - 09 Jul 2003. pp. 61-67 . (doi:10.1109/OLT.2003.1214368).
Record type:
Conference or Workshop Item
(Paper)
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Published date: July 2003
Venue - Dates:
9th IEEE International On-Line Testing Symposium, Kos Island, Greece, 2003-07-07 - 2003-07-09
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368877
URI: http://eprints.soton.ac.uk/id/eprint/368877
ISBN: 0-7695-1968-7
PURE UUID: 11df3e29-ff58-4c4c-8da5-7d84f74d3ac5
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Date deposited: 06 Oct 2014 12:20
Last modified: 14 Mar 2024 17:55
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Contributors
Author:
Daniele Rossi
Author:
V.E.S. Van Dijk
Author:
Richard Kleihorst
Author:
Andre' Nieuwland
Author:
Cecilia Metra
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