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Impact of ECCs on simultaneously switching output noise for on-chip busses of high reliability systems [error correcting codes]

Impact of ECCs on simultaneously switching output noise for on-chip busses of high reliability systems [error correcting codes]
Impact of ECCs on simultaneously switching output noise for on-chip busses of high reliability systems [error correcting codes]
In this paper, we analyze the impact of error correcting codes (ECCs) on simultaneously switching outputs (SSO) noise, for the case of a realistic bus of a high reliability system. First, we analyze the effect of different bus transitions on SSO noise. Then we show how different ECCs, requiring a different number of check bits, impact the SSO noise. We prove that Hamming codes cause less noise than the ECCs that have been proposed so far to reduce power consumption and crosstalk-induced delay. In particular, we show that the code requirements for crosstalk and power minimization in terms of switching activity of adjacent wires are opposite to those for SSO noise reduction. Our analysis has been performed considering realistic bus and power supply network models, both implemented using a standard 0.25 ?m CMOS technology.
0-7695-2180-0
135-140
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Muccio, Andrea
a6390879-8840-4d31-9ae7-111535dbb1e2
Nieuwland, Andre
6c193e4a-4779-4711-885e-e6377b5e6442
Katoch, Atul
2b10bb54-f879-4fa2-a472-a56c40af574c
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Muccio, Andrea
a6390879-8840-4d31-9ae7-111535dbb1e2
Nieuwland, Andre
6c193e4a-4779-4711-885e-e6377b5e6442
Katoch, Atul
2b10bb54-f879-4fa2-a472-a56c40af574c
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae

Rossi, Daniele, Muccio, Andrea, Nieuwland, Andre, Katoch, Atul and Metra, Cecilia (2004) Impact of ECCs on simultaneously switching output noise for on-chip busses of high reliability systems [error correcting codes]. 10th IEEE International On-Line Testing Symposium (IOLTS 2004). Proceedings, Funchal, Portugal. 11 - 14 Jul 2004. pp. 135-140 . (doi:10.1109/OLT.2004.1319671).

Record type: Conference or Workshop Item (Paper)

Abstract

In this paper, we analyze the impact of error correcting codes (ECCs) on simultaneously switching outputs (SSO) noise, for the case of a realistic bus of a high reliability system. First, we analyze the effect of different bus transitions on SSO noise. Then we show how different ECCs, requiring a different number of check bits, impact the SSO noise. We prove that Hamming codes cause less noise than the ECCs that have been proposed so far to reduce power consumption and crosstalk-induced delay. In particular, we show that the code requirements for crosstalk and power minimization in terms of switching activity of adjacent wires are opposite to those for SSO noise reduction. Our analysis has been performed considering realistic bus and power supply network models, both implemented using a standard 0.25 ?m CMOS technology.

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Published date: July 2004
Venue - Dates: 10th IEEE International On-Line Testing Symposium (IOLTS 2004). Proceedings, Funchal, Portugal, 2004-07-11 - 2004-07-14
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 368883
URI: http://eprints.soton.ac.uk/id/eprint/368883
ISBN: 0-7695-2180-0
PURE UUID: 7326207f-add3-4978-a804-6ae31a68f7e8

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Date deposited: 08 Oct 2014 11:08
Last modified: 14 Mar 2024 17:55

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Contributors

Author: Daniele Rossi
Author: Andrea Muccio
Author: Andre Nieuwland
Author: Atul Katoch
Author: Cecilia Metra

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