Multiple transient faults in logic: an issue for next generation ICs?
Multiple transient faults in logic: an issue for next generation ICs?
In this paper, we first evaluate whether or not a multiple transient fault (multiple TF) generated by the hit of a single cosmic ray neutron can give rise to a bidirectional error at the circuit output (that is an error in which all erroneous bits are 1s rather than 0s, or vice versa, within the same word, but not both). By means of electrical level simulations, we show that this can be the case. Then, we present a software tool that we have developed in order to evaluate the likelihood of occurrence of such bidirectional errors for very deep submicron (VDSM) ICs. The application of this tool to benchmark circuits has proven that such a probability can not be neglected for several benchmark circuits. Finally, we evaluate the behavior of conventional self-checking circuits (generally designed accounting only for single TFs) with respect to such events. We show that the modifications generally introduced to their functional blocks in order to avoid output bidirectional errors due to single TFs (as required when an AUED code is implemented) can significantly reduce (up to the 40%) also the probability to have bidirectional errors because of multiple TFs.
0-7695-2464-8
352-360
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Toma, Fabio
77ed2aa1-0434-4a77-92c5-a118b5ec3cda
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
October 2005
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Toma, Fabio
77ed2aa1-0434-4a77-92c5-a118b5ec3cda
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele, Omana, Martin, Toma, Fabio and Metra, Cecilia
(2005)
Multiple transient faults in logic: an issue for next generation ICs?
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2005), Monterey, United States.
03 - 05 Oct 2005.
.
(doi:10.1109/DFTVS.2005.47).
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Conference or Workshop Item
(Paper)
Abstract
In this paper, we first evaluate whether or not a multiple transient fault (multiple TF) generated by the hit of a single cosmic ray neutron can give rise to a bidirectional error at the circuit output (that is an error in which all erroneous bits are 1s rather than 0s, or vice versa, within the same word, but not both). By means of electrical level simulations, we show that this can be the case. Then, we present a software tool that we have developed in order to evaluate the likelihood of occurrence of such bidirectional errors for very deep submicron (VDSM) ICs. The application of this tool to benchmark circuits has proven that such a probability can not be neglected for several benchmark circuits. Finally, we evaluate the behavior of conventional self-checking circuits (generally designed accounting only for single TFs) with respect to such events. We show that the modifications generally introduced to their functional blocks in order to avoid output bidirectional errors due to single TFs (as required when an AUED code is implemented) can significantly reduce (up to the 40%) also the probability to have bidirectional errors because of multiple TFs.
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Published date: October 2005
Venue - Dates:
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2005), Monterey, United States, 2005-10-03 - 2005-10-05
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368891
URI: http://eprints.soton.ac.uk/id/eprint/368891
ISBN: 0-7695-2464-8
PURE UUID: ad01aa3e-c028-44ee-b940-cb7d3ce07d73
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Date deposited: 08 Oct 2014 15:05
Last modified: 14 Mar 2024 17:55
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Author:
Daniele Rossi
Author:
Martin Omana
Author:
Fabio Toma
Author:
Cecilia Metra
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