Configurable error control scheme for NoC signal integrity
Configurable error control scheme for NoC signal integrity
In this paper we propose a novel error control scheme to cope with errors affecting the communication links of a NoC. Our scheme can be configured in correction mode, detection mode, and mixed mode, depending on the particular application, thus allowing to meet different quality of service (QoS) levels in terms of error control. For each configuration mode, we propose different error control policies and we consider SEC hamming codes SEC/DED Hsiao codes, and symbol error correcting codes. We evaluate advantages and drawbacks of each approach, in terms of signal integrity, area overhead and impact on performance.
0-7695-2918-6
43-48
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Angelini, Paolo
10a78321-e0f3-488e-9e40-347a5740b913
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
July 2007
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Angelini, Paolo
10a78321-e0f3-488e-9e40-347a5740b913
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Rossi, Daniele, Angelini, Paolo and Metra, Cecilia
(2007)
Configurable error control scheme for NoC signal integrity.
13th IEEE International On-Line Testing Symposium, Crete, Greece.
08 - 11 Jul 2007.
.
(doi:10.1109/IOLTS.2007.24).
Record type:
Conference or Workshop Item
(Paper)
Abstract
In this paper we propose a novel error control scheme to cope with errors affecting the communication links of a NoC. Our scheme can be configured in correction mode, detection mode, and mixed mode, depending on the particular application, thus allowing to meet different quality of service (QoS) levels in terms of error control. For each configuration mode, we propose different error control policies and we consider SEC hamming codes SEC/DED Hsiao codes, and symbol error correcting codes. We evaluate advantages and drawbacks of each approach, in terms of signal integrity, area overhead and impact on performance.
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iolts07.pdf
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Published date: July 2007
Venue - Dates:
13th IEEE International On-Line Testing Symposium, Crete, Greece, 2007-07-08 - 2007-07-11
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368903
URI: http://eprints.soton.ac.uk/id/eprint/368903
ISBN: 0-7695-2918-6
PURE UUID: 136bf34f-7a47-45b8-ba35-a6942206d43f
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Date deposited: 02 Oct 2014 12:46
Last modified: 14 Mar 2024 17:55
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Contributors
Author:
Daniele Rossi
Author:
Paolo Angelini
Author:
Cecilia Metra
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