Novel high speed robust latch
Novel high speed robust latch
In this paper we propose a new robust latch, referred to as HiPeR latch. It is insensitive to TFs affecting its internal and output nodes by design (independently of the size of its transistors), thus being scalable with technology node. It presents better or comparable robustness to TFs compared to the most recent latches in literature, while providing better characteristics in terms of performance at comparable area and power cost.
robust latch, soft error, transient fault
978-0-7695-3839-6
65-73
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Omana, Martin, Rossi, Daniele and Metra, Cecilia
(2009)
Novel high speed robust latch.
24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Chicago, United States.
07 - 09 Oct 2009.
.
(doi:10.1109/DFT.2009.40).
Record type:
Conference or Workshop Item
(Paper)
Abstract
In this paper we propose a new robust latch, referred to as HiPeR latch. It is insensitive to TFs affecting its internal and output nodes by design (independently of the size of its transistors), thus being scalable with technology node. It presents better or comparable robustness to TFs compared to the most recent latches in literature, while providing better characteristics in terms of performance at comparable area and power cost.
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e-pub ahead of print date: October 2009
Venue - Dates:
24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Chicago, United States, 2009-10-07 - 2009-10-09
Keywords:
robust latch, soft error, transient fault
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368907
URI: http://eprints.soton.ac.uk/id/eprint/368907
ISBN: 978-0-7695-3839-6
PURE UUID: 235c5583-abe9-46b8-8847-7feee8232257
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Date deposited: 17 Sep 2014 10:23
Last modified: 14 Mar 2024 17:56
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Contributors
Author:
Martin Omana
Author:
Daniele Rossi
Author:
Cecilia Metra
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