Self-checking monitor for NBTI due degradation
Self-checking monitor for NBTI due degradation
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. In this paper we propose a monitor able to detect NBTI due late transitions in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption. Moreover, differently from alternative solutions, our monitor is also self-checking with respect to its possible internal faults, thus avoiding the useless negative impact on system performance and the negative impact on system reliability which could otherwise take place in case of non self-checking sensors, should they get affected by faults.
NBTI degradation, critical data-path, monitor, selfchecking circuit
978-1-4244-7791-3
1-6
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Bosio, Nicolo'
3642ab3d-ca0b-4bf6-b6a3-b72994db7e8c
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
June 2010
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Bosio, Nicolo'
3642ab3d-ca0b-4bf6-b6a3-b72994db7e8c
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Omana, Martin, Rossi, Daniele, Bosio, Nicolo' and Metra, Cecilia
(2010)
Self-checking monitor for NBTI due degradation.
IEEE International Mixed-Signals, Sensors, and Systems Test Workshop, Montpellier, France.
07 - 09 Jun 2010.
.
(doi:10.1109/IMS3TW.2010.5503006).
Record type:
Conference or Workshop Item
(Paper)
Abstract
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. In this paper we propose a monitor able to detect NBTI due late transitions in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption. Moreover, differently from alternative solutions, our monitor is also self-checking with respect to its possible internal faults, thus avoiding the useless negative impact on system performance and the negative impact on system reliability which could otherwise take place in case of non self-checking sensors, should they get affected by faults.
Text
ims3tw10.pdf
- Accepted Manuscript
More information
Published date: June 2010
Venue - Dates:
IEEE International Mixed-Signals, Sensors, and Systems Test Workshop, Montpellier, France, 2010-06-07 - 2010-06-09
Keywords:
NBTI degradation, critical data-path, monitor, selfchecking circuit
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368910
URI: http://eprints.soton.ac.uk/id/eprint/368910
ISBN: 978-1-4244-7791-3
PURE UUID: 66995c1b-08e3-4a7e-aab9-6f52da1ea6a4
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Date deposited: 16 Sep 2014 14:24
Last modified: 14 Mar 2024 17:56
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Contributors
Author:
Martin Omana
Author:
Daniele Rossi
Author:
Nicolo' Bosio
Author:
Cecilia Metra
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