Faults affecting the control blocks of PV arrays and techniques for their concurrent detection
Faults affecting the control blocks of PV arrays and techniques for their concurrent detection
Viz analyze the effects of the faults that are most likely to affect the control circuitry of photovoltaic (PV) arrays, that is their Maximum Power Point Tracker (MPPT) and DC-AC converter. Particularly, we study their possible impact on the efficiency of the whole PV system and we prove that they may produce catastrophic effects on the PV array power efficiency. Based on these achieved results, we then propose two novel low-cost approaches for the concurrent detection of the faults most likely to affect the MPPT and the DC-AC converter. These approaches could allow the activation of proper reconfiguration schemes upon fault detection, thus avoiding the detrimental effects on the PV system efficiency due to such faults occurrence.
978-1-4673-3043-5
199-204
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Collepalumbo, Giacomo
705e3c29-a26a-4c43-b160-40d56771d76b
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Lombardi, Fabrizio
e36a0194-d0fc-443b-82c5-72cefd730b0f
Omana, Martin
7c091df8-0526-4d15-aa3f-f25dea90dd18
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Collepalumbo, Giacomo
705e3c29-a26a-4c43-b160-40d56771d76b
Metra, Cecilia
c420be13-a9cf-471a-96fb-3f43a694ffae
Lombardi, Fabrizio
e36a0194-d0fc-443b-82c5-72cefd730b0f
Omana, Martin, Rossi, Daniele, Collepalumbo, Giacomo, Metra, Cecilia and Lombardi, Fabrizio
(2012)
Faults affecting the control blocks of PV arrays and techniques for their concurrent detection.
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Austin, United States.
03 - 05 Oct 2012.
.
(doi:10.1109/DFT.2012.6378224).
Record type:
Conference or Workshop Item
(Paper)
Abstract
Viz analyze the effects of the faults that are most likely to affect the control circuitry of photovoltaic (PV) arrays, that is their Maximum Power Point Tracker (MPPT) and DC-AC converter. Particularly, we study their possible impact on the efficiency of the whole PV system and we prove that they may produce catastrophic effects on the PV array power efficiency. Based on these achieved results, we then propose two novel low-cost approaches for the concurrent detection of the faults most likely to affect the MPPT and the DC-AC converter. These approaches could allow the activation of proper reconfiguration schemes upon fault detection, thus avoiding the detrimental effects on the PV system efficiency due to such faults occurrence.
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e-pub ahead of print date: October 2012
Venue - Dates:
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Austin, United States, 2012-10-03 - 2012-10-05
Organisations:
Electronic & Software Systems
Identifiers
Local EPrints ID: 368916
URI: http://eprints.soton.ac.uk/id/eprint/368916
ISBN: 978-1-4673-3043-5
PURE UUID: 372ba320-0a28-4642-932d-f4a343ca5a6b
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Date deposited: 16 Sep 2014 16:23
Last modified: 14 Mar 2024 17:56
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Contributors
Author:
Martin Omana
Author:
Daniele Rossi
Author:
Giacomo Collepalumbo
Author:
Cecilia Metra
Author:
Fabrizio Lombardi
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