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Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix

Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix
Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix
The results of Raman microspectroscopy measurements of octamethylsilsesquioxane (om-POSS) (3-wt %) in polypropylene (PP) are presented and compared with theoretical spectra calculated by ab initio density functional theory (DFT) based methods. The internal structure of this dielectric composite at the micrometer level was obtained by Computerized X-ray microtomography (CX?T) which reveals how micron-scale filler particles are distributed in the matrix media. The X–ray powder diffraction (XPD) was used to determine the om-POSS inner crystallite size that is in a nanometer range. Transmission electron microscopy (TEM) images confirm that the composite contains both nano and micron sized particles. The multiscale analysis indicates that in the composite om-POSS crystalline nanoparticles having a size from tens to hundreds of nanometers tend to agglomerate together with preferred orientation to form elongated micron sized particles. Orientation of crystallites affects the relative intensity of various Raman peaks. Appearance of Raman images thus depends on the choice of the peak used in the analysis.
9521525622
195-198
Virtanen, Suvi
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Kortelainen, Tommi
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Ahonen, Susanna
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Koivu, Viivi
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Lahtinen, Manu
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Arola, Eero
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Kortet, Satu
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Karttunen, Mikko
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Kannus, Kari
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Pettersson, Mika
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Virtanen, Suvi
5f98459d-e6b8-45d4-bdf8-85d264b3f43a
Kortelainen, Tommi
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Ahonen, Susanna
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Koivu, Viivi
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Lahtinen, Manu
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Arola, Eero
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Kortet, Satu
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Karttunen, Mikko
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Kannus, Kari
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Pettersson, Mika
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Virtanen, Suvi, Kortelainen, Tommi, Ahonen, Susanna, Koivu, Viivi, Lahtinen, Manu, Arola, Eero, Kortet, Satu, Karttunen, Mikko, Kannus, Kari and Pettersson, Mika (2011) Characterization of octamethylsilsesquioxane (CH3)8Si8O12 fillers in polypropene matrix. Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11. pp. 195-198 .

Record type: Conference or Workshop Item (Paper)

Abstract

The results of Raman microspectroscopy measurements of octamethylsilsesquioxane (om-POSS) (3-wt %) in polypropylene (PP) are presented and compared with theoretical spectra calculated by ab initio density functional theory (DFT) based methods. The internal structure of this dielectric composite at the micrometer level was obtained by Computerized X-ray microtomography (CX?T) which reveals how micron-scale filler particles are distributed in the matrix media. The X–ray powder diffraction (XPD) was used to determine the om-POSS inner crystallite size that is in a nanometer range. Transmission electron microscopy (TEM) images confirm that the composite contains both nano and micron sized particles. The multiscale analysis indicates that in the composite om-POSS crystalline nanoparticles having a size from tens to hundreds of nanometers tend to agglomerate together with preferred orientation to form elongated micron sized particles. Orientation of crystallites affects the relative intensity of various Raman peaks. Appearance of Raman images thus depends on the choice of the peak used in the analysis.

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Published date: June 2011
Venue - Dates: Proceedings of the 22nd Nordic Insulation Symposium, NORD-IS 11, 2011-06-01
Organisations: EEE

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Local EPrints ID: 370308
URI: http://eprints.soton.ac.uk/id/eprint/370308
ISBN: 9521525622
PURE UUID: 1056c31c-71d3-477a-91ae-143e0ec983aa
ORCID for Suvi Virtanen: ORCID iD orcid.org/0000-0003-0502-3183

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Date deposited: 29 Oct 2014 11:45
Last modified: 14 Mar 2024 18:15

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Contributors

Author: Suvi Virtanen ORCID iD
Author: Tommi Kortelainen
Author: Susanna Ahonen
Author: Viivi Koivu
Author: Manu Lahtinen
Author: Eero Arola
Author: Satu Kortet
Author: Mikko Karttunen
Author: Kari Kannus
Author: Mika Pettersson

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