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Accelerated testing of multi-walled CNT composite electrical contacts for MEMS switches

Accelerated testing of multi-walled CNT composite electrical contacts for MEMS switches
Accelerated testing of multi-walled CNT composite electrical contacts for MEMS switches
The use of gold-coated multi-walled carbon nanotube (Au/MWCNT) bilayer composite surfaces has been discussed in previous work as a method for improving the reliability of switch contacts [1, 2]. A consequence of large lifetimes means that testing to failure is time consuming. To address this we developed a MEMS-based test platform which enables testing at high frequency [3]. The MEMS devices were developed in a two stage process. In this paper the results obtained from the first stage design for a MEMS-based test platform device are discussed. Further to this, an overview of the design of the second stage device is given. Using the first-stage device, at a current of 50 mA (at 4 V), the composite yielded a lifetime in excess of 44 million hot-switching cycles [4]. At a lower load current of 10 mA, the contact maintained a stable contact for >500 million hot-switching cycles. As well as monitoring the contact resistance, SEM images of the surface before and after testing are presented. The first stage MEMS-based developmental device is a step towards a smaller integrated and packaged high-lifetime metal-contacting MEMS switch. An overview of the considerations for the redesign is given with a discussion on the predicted performance and improvement for accelerated switch testing.
Lewis, Adam P.
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McBride, John W.
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Pu, Suan-Hui
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Jiang, Liudi
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Lewis, Adam P.
4c3eefcd-e5c3-46be-9004-91fd706ec385
McBride, John W.
d9429c29-9361-4747-9ba3-376297cb8770
Pu, Suan-Hui
8b46b970-56fd-4a4e-8688-28668f648f43
Jiang, Liudi
374f2414-51f0-418f-a316-e7db0d6dc4d1

Lewis, Adam P., McBride, John W., Pu, Suan-Hui and Jiang, Liudi (2015) Accelerated testing of multi-walled CNT composite electrical contacts for MEMS switches. 16th Electronics Packaging Technology Conference (EPTC 2014), Singapore, Singapore. 03 - 05 Dec 2014. 5 pp . (doi:10.1109/EPTC.2014.7028348).

Record type: Conference or Workshop Item (Paper)

Abstract

The use of gold-coated multi-walled carbon nanotube (Au/MWCNT) bilayer composite surfaces has been discussed in previous work as a method for improving the reliability of switch contacts [1, 2]. A consequence of large lifetimes means that testing to failure is time consuming. To address this we developed a MEMS-based test platform which enables testing at high frequency [3]. The MEMS devices were developed in a two stage process. In this paper the results obtained from the first stage design for a MEMS-based test platform device are discussed. Further to this, an overview of the design of the second stage device is given. Using the first-stage device, at a current of 50 mA (at 4 V), the composite yielded a lifetime in excess of 44 million hot-switching cycles [4]. At a lower load current of 10 mA, the contact maintained a stable contact for >500 million hot-switching cycles. As well as monitoring the contact resistance, SEM images of the surface before and after testing are presented. The first stage MEMS-based developmental device is a step towards a smaller integrated and packaged high-lifetime metal-contacting MEMS switch. An overview of the considerations for the redesign is given with a discussion on the predicted performance and improvement for accelerated switch testing.

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e-pub ahead of print date: December 2014
Published date: 2 February 2015
Venue - Dates: 16th Electronics Packaging Technology Conference (EPTC 2014), Singapore, Singapore, 2014-12-03 - 2014-12-05
Organisations: Engineering Mats & Surface Engineerg Gp, Mechatronics, Engineering Science Unit

Identifiers

Local EPrints ID: 370607
URI: http://eprints.soton.ac.uk/id/eprint/370607
PURE UUID: 5fe45fed-b72b-415d-ab2b-73a720393169
ORCID for John W. McBride: ORCID iD orcid.org/0000-0002-3024-0326
ORCID for Suan-Hui Pu: ORCID iD orcid.org/0000-0002-3335-8880
ORCID for Liudi Jiang: ORCID iD orcid.org/0000-0002-3400-825X

Catalogue record

Date deposited: 03 Nov 2014 11:09
Last modified: 15 Mar 2024 04:02

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Contributors

Author: Adam P. Lewis
Author: John W. McBride ORCID iD
Author: Suan-Hui Pu ORCID iD
Author: Liudi Jiang ORCID iD

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