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A differential measurement technique to eliminate parasitic resistance effects in ion sensitive sensors

Zeimpekis, Ioannis, Sun, Kai, Hu, Chunxiao, Thomas, Owain, de Planque, Maurits R.R., Chong, Harold M.H., Morgan, Hywel and Ashburn, Peter (2014) A differential measurement technique to eliminate parasitic resistance effects in ion sensitive sensors At Micro and Nano Engineering, Switzerland. 22 - 26 Sep 2014.

Record type: Conference or Workshop Item (Poster)

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Published date: 25 September 2014
Venue - Dates: Micro and Nano Engineering, Switzerland, 2014-09-22 - 2014-09-26
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 371589
URI: http://eprints.soton.ac.uk/id/eprint/371589
PURE UUID: 55ec16a5-2679-44c2-ab29-5d51154c4fd1
ORCID for Maurits R.R. de Planque: ORCID iD orcid.org/0000-0002-8787-0513
ORCID for Hywel Morgan: ORCID iD orcid.org/0000-0003-4850-5676

Catalogue record

Date deposited: 09 Nov 2014 21:30
Last modified: 17 Jul 2017 21:48

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Contributors

Author: Ioannis Zeimpekis
Author: Kai Sun
Author: Chunxiao Hu
Author: Owain Thomas
Author: Harold M.H. Chong
Author: Hywel Morgan ORCID iD
Author: Peter Ashburn

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