A differential measurement technique to eliminate parasitic resistance effects in ion sensitive sensors


Zeimpekis, Ioannis, Sun, Kai, Hu, Chunxiao, Thomas, Owain, de Planque, Maurits R.R., Chong, Harold M.H., Morgan, Hywel and Ashburn, Peter (2014) A differential measurement technique to eliminate parasitic resistance effects in ion sensitive sensors At Micro and Nano Engineering, Switzerland. 22 - 26 Sep 2014.

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Item Type: Conference or Workshop Item (Poster)
Venue - Dates: Micro and Nano Engineering, Switzerland, 2014-09-22 - 2014-09-26
Organisations: Nanoelectronics and Nanotechnology
ePrint ID: 371589
Date :
Date Event
25 September 2014Published
Date Deposited: 09 Nov 2014 21:30
Last Modified: 17 Apr 2017 07:06
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/371589

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