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Finite element based surface roughness study for ohmic contact of microswitches

Finite element based surface roughness study for ohmic contact of microswitches
Finite element based surface roughness study for ohmic contact of microswitches
Finite element method (FEM) is used to model ohmic contact in microswitches. A determinist approach is adopted, including atomic force microscope (AFM) scanning real contact surfaces and generating rough surfaces with three-dimensional mesh. FE frictionless models are set up with the elastoplastic material and the simulations are performed with a loading-unloading cycle. Two material properties, gold and ruthenium, are studied in the simulations. The effect of roughness is investigated by comparing the models with several smoothing intensities and asperity heights. The comparison is quantitatively analyzed with relations of force vs. displacement, force vs. contact area and force vs. electrical contact resistance (ECR); further the evolution of spots in contact during a loading-unloading cycle is studied.
978-1-4673-0778-9
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38
Colin, Stephane
4045afbc-754d-4ec2-ba09-2575f83a3ac7
Pons, Patrick
c6126310-1cb0-471a-a6e0-f0038785051b
Broue, Adrien
84c1f89a-6299-4563-8777-be27d17fe1e9
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38
Colin, Stephane
4045afbc-754d-4ec2-ba09-2575f83a3ac7
Pons, Patrick
c6126310-1cb0-471a-a6e0-f0038785051b
Broue, Adrien
84c1f89a-6299-4563-8777-be27d17fe1e9

Liu, Hong, Leray, Dimitri, Colin, Stephane, Pons, Patrick and Broue, Adrien (2012) Finite element based surface roughness study for ohmic contact of microswitches. 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm 2012), United States. 23 - 26 Sep 2012. (doi:10.1109/HOLM.2012.6336607).

Record type: Conference or Workshop Item (Paper)

Abstract

Finite element method (FEM) is used to model ohmic contact in microswitches. A determinist approach is adopted, including atomic force microscope (AFM) scanning real contact surfaces and generating rough surfaces with three-dimensional mesh. FE frictionless models are set up with the elastoplastic material and the simulations are performed with a loading-unloading cycle. Two material properties, gold and ruthenium, are studied in the simulations. The effect of roughness is investigated by comparing the models with several smoothing intensities and asperity heights. The comparison is quantitatively analyzed with relations of force vs. displacement, force vs. contact area and force vs. electrical contact resistance (ECR); further the evolution of spots in contact during a loading-unloading cycle is studied.

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More information

Published date: 23 September 2012
Venue - Dates: 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm 2012), United States, 2012-09-23 - 2012-09-26
Organisations: Engineering Mats & Surface Engineerg Gp, Mechatronics, Faculty of Engineering and the Environment

Identifiers

Local EPrints ID: 371653
URI: http://eprints.soton.ac.uk/id/eprint/371653
ISBN: 978-1-4673-0778-9
PURE UUID: 4f27492f-4ff0-4c96-bd66-4a286b4cd1b7

Catalogue record

Date deposited: 11 Nov 2014 12:57
Last modified: 16 Dec 2019 20:22

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