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A comparison of the predictions of a finite element model and multiscale model for a rough MEMS electrical contact

A comparison of the predictions of a finite element model and multiscale model for a rough MEMS electrical contact
A comparison of the predictions of a finite element model and multiscale model for a rough MEMS electrical contact
Rough surface contact is difficult to model effectively due to multiple scales of detail that need to be considered. This work presents the results of a multiscale rough surface contact model in comparison to a finite element based deterministic model for the electrical contact of a MEMS microswitch. The real area of contact and electrical contact resistance are predicted and compared as a function of normal load. The results show good quantitative and qualitative correlation between the two methods. As expected, the contact area increases nominally linearly with load, while the contact resistance decreases with load. It is notable though that the contact pressure is up to 16% higher than the hardness (2.8 times yield strength), and could be even higher for other surfaces.
978-1-4799-1556-9
Jackson, Robert L.
3153416b-fe46-4cea-8824-1e48e05a02bb
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38
Jackson, Robert L.
3153416b-fe46-4cea-8824-1e48e05a02bb
Liu, Hong
e8808574-7eb8-459e-9539-110a1f76e117
Leray, Dimitri
47faeb6d-7522-4c9e-9f50-4a04bf1aaf38

Jackson, Robert L., Liu, Hong and Leray, Dimitri (2013) A comparison of the predictions of a finite element model and multiscale model for a rough MEMS electrical contact. 2013 IEEE 59th Holm Conference on Electrical Contacts. 22 - 25 Sep 2013. (doi:10.1109/HOLM.2013.6651394).

Record type: Conference or Workshop Item (Paper)

Abstract

Rough surface contact is difficult to model effectively due to multiple scales of detail that need to be considered. This work presents the results of a multiscale rough surface contact model in comparison to a finite element based deterministic model for the electrical contact of a MEMS microswitch. The real area of contact and electrical contact resistance are predicted and compared as a function of normal load. The results show good quantitative and qualitative correlation between the two methods. As expected, the contact area increases nominally linearly with load, while the contact resistance decreases with load. It is notable though that the contact pressure is up to 16% higher than the hardness (2.8 times yield strength), and could be even higher for other surfaces.

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Holm2013Jackson_Liu.pdf - Accepted Manuscript
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More information

Published date: September 2013
Venue - Dates: 2013 IEEE 59th Holm Conference on Electrical Contacts, 2013-09-22 - 2013-09-25
Organisations: Engineering Mats & Surface Engineerg Gp, Mechatronics, Faculty of Engineering and the Environment

Identifiers

Local EPrints ID: 371654
URI: http://eprints.soton.ac.uk/id/eprint/371654
ISBN: 978-1-4799-1556-9
PURE UUID: c7497fff-92cd-4db8-88e1-58a2b90d0988

Catalogue record

Date deposited: 11 Nov 2014 13:05
Last modified: 04 Nov 2019 20:22

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