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Device-level characterization of the flow of light in integrated photonic circuits using ultrafast photomodulation spectroscopy

Device-level characterization of the flow of light in integrated photonic circuits using ultrafast photomodulation spectroscopy
Device-level characterization of the flow of light in integrated photonic circuits using ultrafast photomodulation spectroscopy
Advances in silicon photonics have resulted in rapidly increasing complexity of integrated circuits. New methods are desirable that allow direct characterization of individual optical components in-situ, without the need for additional fabrication steps or test structures. Here, we present a new device-level method for characterization of photonic chips based on a highly localized modulation in the device using pulsed laser excitation. Optical pumping perturbs the refractive index of silicon, providing a spatially and temporally localized modulation in the transmitted light enabling time- and frequency-resolved imaging. We demonstrate the versatility of this all-optical modulation technique in imaging and in quantitative characterization of a variety of properties of silicon photonic devices, ranging from group indices in waveguides, quality factors of a ring resonator to the mode structure of a multimode interference device. Ultrafast photomodulation spectroscopy provides important information on devices of complex design, and is easily applicable for testing on the device-level.
1749-4885
54-60
Bruck, Roman
6c0a8401-0a93-4497-bd42-665e5530cfcf
Mills, Ben
05f1886e-96ef-420f-b856-4115f4ab36d0
Troia, Benedetto
e90140d1-2449-4ca0-b2d4-aac7a1464c5c
Thomson, David J.
17c1626c-2422-42c6-98e0-586ae220bcda
Gardes, Frederic Y.
7a49fc6d-dade-4099-b016-c60737cb5bb2
Hu, Youfang
38fe48b3-1609-4834-ad54-dc823e3a98b3
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Passaro, Vittorio M.N.
787696b6-5fbe-4ec7-9a7f-b76b132ac819
Reed, Graham T.
ca08dd60-c072-4d7d-b254-75714d570139
Muskens, Otto L.
2284101a-f9ef-4d79-8951-a6cda5bfc7f9
Bruck, Roman
6c0a8401-0a93-4497-bd42-665e5530cfcf
Mills, Ben
05f1886e-96ef-420f-b856-4115f4ab36d0
Troia, Benedetto
e90140d1-2449-4ca0-b2d4-aac7a1464c5c
Thomson, David J.
17c1626c-2422-42c6-98e0-586ae220bcda
Gardes, Frederic Y.
7a49fc6d-dade-4099-b016-c60737cb5bb2
Hu, Youfang
38fe48b3-1609-4834-ad54-dc823e3a98b3
Mashanovich, Goran Z.
c806e262-af80-4836-b96f-319425060051
Passaro, Vittorio M.N.
787696b6-5fbe-4ec7-9a7f-b76b132ac819
Reed, Graham T.
ca08dd60-c072-4d7d-b254-75714d570139
Muskens, Otto L.
2284101a-f9ef-4d79-8951-a6cda5bfc7f9

Bruck, Roman, Mills, Ben, Troia, Benedetto, Thomson, David J., Gardes, Frederic Y., Hu, Youfang, Mashanovich, Goran Z., Passaro, Vittorio M.N., Reed, Graham T. and Muskens, Otto L. (2014) Device-level characterization of the flow of light in integrated photonic circuits using ultrafast photomodulation spectroscopy. Nature Photonics, 9, 54-60. (doi:10.1038/NPHOTON.2014.274).

Record type: Article

Abstract

Advances in silicon photonics have resulted in rapidly increasing complexity of integrated circuits. New methods are desirable that allow direct characterization of individual optical components in-situ, without the need for additional fabrication steps or test structures. Here, we present a new device-level method for characterization of photonic chips based on a highly localized modulation in the device using pulsed laser excitation. Optical pumping perturbs the refractive index of silicon, providing a spatially and temporally localized modulation in the transmitted light enabling time- and frequency-resolved imaging. We demonstrate the versatility of this all-optical modulation technique in imaging and in quantitative characterization of a variety of properties of silicon photonic devices, ranging from group indices in waveguides, quality factors of a ring resonator to the mode structure of a multimode interference device. Ultrafast photomodulation spectroscopy provides important information on devices of complex design, and is easily applicable for testing on the device-level.

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Accepted/In Press date: 2 October 2014
e-pub ahead of print date: 17 November 2014
Published date: 17 November 2014
Organisations: Optoelectronics Research Centre, Quantum, Light & Matter Group

Identifiers

Local EPrints ID: 372220
URI: https://eprints.soton.ac.uk/id/eprint/372220
ISSN: 1749-4885
PURE UUID: 70834ee6-ef1c-4815-8f80-93e3407b1a62
ORCID for Ben Mills: ORCID iD orcid.org/0000-0002-1784-1012
ORCID for Otto L. Muskens: ORCID iD orcid.org/0000-0003-0693-5504

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Date deposited: 03 Dec 2014 10:08
Last modified: 19 Nov 2019 01:45

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Contributors

Author: Roman Bruck
Author: Ben Mills ORCID iD
Author: Benedetto Troia
Author: Youfang Hu
Author: Vittorio M.N. Passaro
Author: Graham T. Reed
Author: Otto L. Muskens ORCID iD

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