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Relation between trapping parameters and ageing based on a new electro-thermo kinetic equation

Relation between trapping parameters and ageing based on a new electro-thermo kinetic equation
Relation between trapping parameters and ageing based on a new electro-thermo kinetic equation
Ageing process in low-density polyethylene (LDPE) thin films is investigated based on a newly developed model. This paper discusses the effect of trap depth and cross-section at the electrode-insulation interface and the bulk. To specify the mechanism responsible for conduction in the model, the slope of the experimental curve ln(J) = f(E) was used in an electric field region varying from 5kV/mm to 45kV/mm to calculate the dielectric permittivity ?r of the samples. It was found that the current-voltage characteristic is dominant by Schottky mechanism at the electrode-insulation interface and Poole-Frenkel effect in the bulk of the insulation. The trap energy depth and cross-section at the interface are 1.35 eV and 2.41×10-16 m2 which are greater than in the bulk 1.02 eV and 1.17×10-21 m2. The results also indicate that trap depths and cross-section may be used as aging markers.
electric fields, electron traps, equations, insulation, mathematical model, space charge
978-1-4799-7525-9
421-424
Alghamdi, Hisham A.
c7a5dbd4-cffb-4985-a9cd-836c4aa1eaf5
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Alghamdi, Hisham A.
c7a5dbd4-cffb-4985-a9cd-836c4aa1eaf5
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819

Alghamdi, Hisham A. and Chen, G. (2014) Relation between trapping parameters and ageing based on a new electro-thermo kinetic equation. IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), United States. 19 - 22 Oct 2014. pp. 421-424 . (doi:10.1109/CEIDP.2014.6995765).

Record type: Conference or Workshop Item (Paper)

Abstract

Ageing process in low-density polyethylene (LDPE) thin films is investigated based on a newly developed model. This paper discusses the effect of trap depth and cross-section at the electrode-insulation interface and the bulk. To specify the mechanism responsible for conduction in the model, the slope of the experimental curve ln(J) = f(E) was used in an electric field region varying from 5kV/mm to 45kV/mm to calculate the dielectric permittivity ?r of the samples. It was found that the current-voltage characteristic is dominant by Schottky mechanism at the electrode-insulation interface and Poole-Frenkel effect in the bulk of the insulation. The trap energy depth and cross-section at the interface are 1.35 eV and 2.41×10-16 m2 which are greater than in the bulk 1.02 eV and 1.17×10-21 m2. The results also indicate that trap depths and cross-section may be used as aging markers.

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e-pub ahead of print date: 19 October 2014
Venue - Dates: IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), United States, 2014-10-19 - 2014-10-22
Keywords: electric fields, electron traps, equations, insulation, mathematical model, space charge
Organisations: EEE

Identifiers

Local EPrints ID: 373289
URI: http://eprints.soton.ac.uk/id/eprint/373289
ISBN: 978-1-4799-7525-9
PURE UUID: 6127f9cd-9648-4595-8c32-4082668cc5e5

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Date deposited: 09 Nov 2015 13:06
Last modified: 19 Jul 2019 20:54

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