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Reliability Analysis of Comparators

Nawi, Illani Mohd, Halak, Basel and Zwolinski, M. (2015) Reliability Analysis of Comparators At DATE Workshop: Designing with Uncertainty - Opportunities & Challenges.

Record type: Conference or Workshop Item (Paper)

Abstract

The lack of study on analogue circuits reliability is likely due to the migration of analogue circuits to their digital equivalents. There are a considerable numbers of important analogue circuits such as amplifiers and comparators used in sensors in portable devices, which may be investigated on its reliability. The small number of investigations on analogue circuit's reliability has initiated the interest in investigating the impact of single event transients or soft errors for analogue circuits. Sensitivity analysis was performed to determine the sensitive parts of the circuit. The sensitivity analysis have indicated that single event transient has lead to erroneous behavior of comparators and eventually cause
failure. The sensitive sub-circuits were later investigated on its dependence on variability of the design variables which covers both process and environment parameters. The variability analysis has proven that it does contribute towards increasing the sensitivity of the comparator to single event transients. Variability has also proven that it could increase the vulnerability of the least sensitive parts of the comparator.

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More information

Published date: 2015
Venue - Dates: DATE Workshop: Designing with Uncertainty - Opportunities & Challenges, 2015-01-01
Organisations: Electronics & Computer Science

Identifiers

Local EPrints ID: 373508
URI: http://eprints.soton.ac.uk/id/eprint/373508
PURE UUID: d14d47a6-226b-4c7e-9f08-94052ec7ebe9
ORCID for M. Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 20 Jan 2015 13:34
Last modified: 13 Jul 2017 16:32

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Contributors

Author: Illani Mohd Nawi
Author: Basel Halak
Author: M. Zwolinski ORCID iD

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