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Mechanisms for surface potential decay on fluorinated epoxy in high voltage DC applications

Mechanisms for surface potential decay on fluorinated epoxy in high voltage DC applications
Mechanisms for surface potential decay on fluorinated epoxy in high voltage DC applications
Epoxy resin has been extensively used for decades as an insulation material in high voltage transmission systems. However, this insulation material does suffer from bulk and surface charging when used as insulating spacer, mainly in high voltage DC applications. By applying fluorination treatment, the surface of polymeric insulation is chemically treated and so modifies charge transport characteristics of the material. In doing so, excellent surface properties can be obtained without compromising the bulk characteristics of the polymeric insulation. In this paper, the authors investigate the surface potential decay performance of non-fluorinated and fluorinated epoxy resin samples. The surface decay performance of insulating material is a crucial parameter in dissipating accumulation of surface and bulk charge that can lead to premature breakdown of the insulating material. The epoxy samples were characterised by Energy Dispersive X-Ray (EDX) analysis to determine the changes in chemical composition of the samples before and after fluorination treatment. Surface potential decay measurement using positive corona discharging was then performed, followed by bulk DC conductivity measurement to further explain the mechanisms which govern the surface potential decay. The existence of surface-fluorinated layer on the treated samples had been found to play a major role in dictating the movement of charges away from the surface during the decay process. The influence of fluorination treatment on the decay mechanisms was discussed.
978-1-4799-7525-9
863-866
Mohamad, A.
f467e7fa-4f52-4bbb-9c42-abda8db09388
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Zhang, Y.
c6568601-0e54-46d9-996e-564abd37fb83
An, Z.
b3c8a24f-a0ca-4b14-b2cd-a26e7beec299
Mohamad, A.
f467e7fa-4f52-4bbb-9c42-abda8db09388
Chen, G.
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Zhang, Y.
c6568601-0e54-46d9-996e-564abd37fb83
An, Z.
b3c8a24f-a0ca-4b14-b2cd-a26e7beec299

Mohamad, A., Chen, G., Zhang, Y. and An, Z. (2014) Mechanisms for surface potential decay on fluorinated epoxy in high voltage DC applications. 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Des Moines, United States. 19 - 22 Oct 2014. pp. 863-866 . (doi:10.1109/CEIDP.2014.6995892).

Record type: Conference or Workshop Item (Paper)

Abstract

Epoxy resin has been extensively used for decades as an insulation material in high voltage transmission systems. However, this insulation material does suffer from bulk and surface charging when used as insulating spacer, mainly in high voltage DC applications. By applying fluorination treatment, the surface of polymeric insulation is chemically treated and so modifies charge transport characteristics of the material. In doing so, excellent surface properties can be obtained without compromising the bulk characteristics of the polymeric insulation. In this paper, the authors investigate the surface potential decay performance of non-fluorinated and fluorinated epoxy resin samples. The surface decay performance of insulating material is a crucial parameter in dissipating accumulation of surface and bulk charge that can lead to premature breakdown of the insulating material. The epoxy samples were characterised by Energy Dispersive X-Ray (EDX) analysis to determine the changes in chemical composition of the samples before and after fluorination treatment. Surface potential decay measurement using positive corona discharging was then performed, followed by bulk DC conductivity measurement to further explain the mechanisms which govern the surface potential decay. The existence of surface-fluorinated layer on the treated samples had been found to play a major role in dictating the movement of charges away from the surface during the decay process. The influence of fluorination treatment on the decay mechanisms was discussed.

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Published date: 20 October 2014
Venue - Dates: 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, Des Moines, United States, 2014-10-19 - 2014-10-22
Organisations: EEE

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Local EPrints ID: 373708
URI: http://eprints.soton.ac.uk/id/eprint/373708
ISBN: 978-1-4799-7525-9
PURE UUID: bae1b077-2437-4f58-9dd3-9a415e806742

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Date deposited: 09 Feb 2015 11:44
Last modified: 02 Dec 2019 20:38

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Contributors

Author: A. Mohamad
Author: G. Chen
Author: Y. Zhang
Author: Z. An

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