X-ray photoelectron spectroscopy studies of thin GexSb40-xS6o films


Jiang, Liudi, Fitzgerald, A.G., Rose, M.J., Christova, K., Manov, A. and Pamukchieva, V. (2002) X-ray photoelectron spectroscopy studies of thin GexSb40-xS6o films Journal of Non-Crystalline Solids, 297, (1), pp. 13-17. (doi:10.1016/S0022-3093(01)00925-5).

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Description/Abstract

Thin GexSb40-xS60 (x = 5, 15, 20, 25 and 27) chalcogenide films have been investigated by X-ray photoelectron spectroscopy (XPS). X-ray photoelectron spectra show that there is a peculiarity in the relative intensity ratio of the Sb 4d photoelectron peak associated with Sb2S3 to the Sb 4d photoelectron peak associated Sb2S5 at an average co-ordination number Z of 2.65-2.67. After contamination and photo-oxidation layers were removed from the surface of the films, X-ray photoelectron spectra were measured again. It has been found that binding energies of the Ge 2p and Sb 3d(3/2) photoelectron peaks, which reflect the electronic structure at lower core energy levels, are independent of Z. However, the binding energies of the Ge 3d and Sb 4d photoelectron peaks are more sensitive to Z and have a discontinuity at Z = 2.65.

Item Type: Article
Digital Object Identifier (DOI): doi:10.1016/S0022-3093(01)00925-5
ISSNs: 0022-3093 (print)
Keywords: C140, X110
Subjects:
Organisations: Engineering Mats & Surface Engineerg Gp
ePrint ID: 37630
Date :
Date Event
January 2002Published
Date Deposited: 24 May 2006
Last Modified: 16 Apr 2017 22:02
Further Information:Google Scholar
URI: http://eprints.soton.ac.uk/id/eprint/37630

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