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X-ray photoelectron spectroscopy studies of thin GexSb40-xS6o films

X-ray photoelectron spectroscopy studies of thin GexSb40-xS6o films
X-ray photoelectron spectroscopy studies of thin GexSb40-xS6o films
Thin GexSb40-xS60 (x = 5, 15, 20, 25 and 27) chalcogenide films have been investigated by X-ray photoelectron spectroscopy (XPS). X-ray photoelectron spectra show that there is a peculiarity in the relative intensity ratio of the Sb 4d photoelectron peak associated with Sb2S3 to the Sb 4d photoelectron peak associated Sb2S5 at an average co-ordination number Z of 2.65-2.67. After contamination and photo-oxidation layers were removed from the surface of the films, X-ray photoelectron spectra were measured again. It has been found that binding energies of the Ge 2p and Sb 3d(3/2) photoelectron peaks, which reflect the electronic structure at lower core energy levels, are independent of Z. However, the binding energies of the Ge 3d and Sb 4d photoelectron peaks are more sensitive to Z and have a discontinuity at Z = 2.65.
C140, X110
0022-3093
13-17
Jiang, Liudi
374f2414-51f0-418f-a316-e7db0d6dc4d1
Fitzgerald, A.G.
a25c0ee4-638b-47b5-987e-cd8969e29345
Rose, M.J.
bd6c0b8a-1e4e-4ce8-be63-6c0bb1cc59a4
Christova, K.
85f36c52-828e-4d88-ac7c-cb2de4e7cfce
Manov, A.
e8c4ad61-725f-44b1-af04-7bff20292193
Pamukchieva, V.
b1053aab-18f9-4f10-935b-09c147be70cb
Jiang, Liudi
374f2414-51f0-418f-a316-e7db0d6dc4d1
Fitzgerald, A.G.
a25c0ee4-638b-47b5-987e-cd8969e29345
Rose, M.J.
bd6c0b8a-1e4e-4ce8-be63-6c0bb1cc59a4
Christova, K.
85f36c52-828e-4d88-ac7c-cb2de4e7cfce
Manov, A.
e8c4ad61-725f-44b1-af04-7bff20292193
Pamukchieva, V.
b1053aab-18f9-4f10-935b-09c147be70cb

Jiang, Liudi, Fitzgerald, A.G., Rose, M.J., Christova, K., Manov, A. and Pamukchieva, V. (2002) X-ray photoelectron spectroscopy studies of thin GexSb40-xS6o films. Journal of Non-Crystalline Solids, 297 (1), 13-17. (doi:10.1016/S0022-3093(01)00925-5).

Record type: Article

Abstract

Thin GexSb40-xS60 (x = 5, 15, 20, 25 and 27) chalcogenide films have been investigated by X-ray photoelectron spectroscopy (XPS). X-ray photoelectron spectra show that there is a peculiarity in the relative intensity ratio of the Sb 4d photoelectron peak associated with Sb2S3 to the Sb 4d photoelectron peak associated Sb2S5 at an average co-ordination number Z of 2.65-2.67. After contamination and photo-oxidation layers were removed from the surface of the films, X-ray photoelectron spectra were measured again. It has been found that binding energies of the Ge 2p and Sb 3d(3/2) photoelectron peaks, which reflect the electronic structure at lower core energy levels, are independent of Z. However, the binding energies of the Ge 3d and Sb 4d photoelectron peaks are more sensitive to Z and have a discontinuity at Z = 2.65.

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More information

Published date: January 2002
Keywords: C140, X110
Organisations: Engineering Mats & Surface Engineerg Gp

Identifiers

Local EPrints ID: 37630
URI: http://eprints.soton.ac.uk/id/eprint/37630
ISSN: 0022-3093
PURE UUID: 99296854-ef8b-4cd3-b5c4-01bd26fb2e98
ORCID for Liudi Jiang: ORCID iD orcid.org/0000-0002-3400-825X

Catalogue record

Date deposited: 24 May 2006
Last modified: 26 Nov 2019 01:45

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