Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films
Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films
Trapatseli, Maria
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Carta, Daniela
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Regoutz, Anna
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Khiat, Ali
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Serb, Alexander
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Gupta, Isha
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Prodromakis, Themistoklis
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May 2015
Trapatseli, Maria
1aea9f6b-2790-48b4-85d5-e600e60f6406
Carta, Daniela
120de978-2aaa-4b4d-bf5f-3625c503040d
Regoutz, Anna
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Khiat, Ali
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Serb, Alexander
30f5ec26-f51d-42b3-85fd-0325a27a792c
Gupta, Isha
11f9ea1a-e38a-45d4-930d-96ac78b3d734
Prodromakis, Themistoklis
d58c9c10-9d25-4d22-b155-06c8437acfbf
Trapatseli, Maria, Carta, Daniela, Regoutz, Anna, Khiat, Ali, Serb, Alexander, Gupta, Isha and Prodromakis, Themistoklis
(2015)
Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films.
EMRS Spring Meeting 2015, Lille, France.
10 - 14 May 2015.
Record type:
Conference or Workshop Item
(Poster)
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More information
Accepted/In Press date: 14 May 2015
Published date: May 2015
Venue - Dates:
EMRS Spring Meeting 2015, Lille, France, 2015-05-10 - 2015-05-14
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 376685
URI: http://eprints.soton.ac.uk/id/eprint/376685
PURE UUID: 57774ced-5811-43f3-81ae-1939e2ecab0a
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Date deposited: 06 May 2015 14:14
Last modified: 12 Dec 2021 04:00
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Contributors
Author:
Maria Trapatseli
Author:
Daniela Carta
Author:
Anna Regoutz
Author:
Ali Khiat
Author:
Alexander Serb
Author:
Isha Gupta
Author:
Themistoklis Prodromakis
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