Mechanical properties and bonding structure of boron carbon nitride films synthesized by dual ion beam sputtering
Mechanical properties and bonding structure of boron carbon nitride films synthesized by dual ion beam sputtering
The BCN films were synthesized on Si (110) wafers by using dual ion beam sputtering deposition from boron carbide target. The influences of ion assist source energy and N2 relative flow rate on the surface roughness, mechanical properties and chemical bonding structure of BCN films were investigated systematically. The surface roughness was measured using non-contact optical surface profilometer and the mechanical properties of BCN films were evaluated with nano-indenter. The BCN films were characterized by using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy and X-ray photoelectron spectroscopy (XPS), respectively. The results showed that the BCN films' surface roughness varied in the range of 5-15 nm, and their hardness and reduced elastic modulus fluctuated in the scope of 18-29 GPa and 192-229 GPa, respectively. When the BCN films' surface roughness varied in the range of 8-12 nm, the values of hardness and reduced elastic modulus were fluctuated slightly. The BCN films with the smoothest surface (Ra=5 nm) and the highest hardness of 28 GPa were obtained at the ion assist source energy of 200 eV and the N2 relative flow rate of 50%. The BCN films were amorphous and contained several bonding states such as B-N, B-C and C-N with B-C-N hybridization.
thin films, sputtering, hardness, surfaces, microstructure
215-224
Zhou, Fei
aaf54725-aefa-4df9-a69c-07b3f60060fc
Wang, Qianzhi
696b2954-9bbe-4e19-a9d2-22435e55d9b4
Yue, Bin
e33839b9-24f2-49ee-b31a-ffb62b0288d1
Wu, Xuemei
4689cce9-0f25-4497-9a2d-a3bb0a3e1f34
Zhuge, Lanjian
dbded7f6-052b-4db8-9501-53427d7551d6
Cheng, Xiaonong
dcfca852-12a9-4604-be17-1c52ba4bcb3f
15 February 2013
Zhou, Fei
aaf54725-aefa-4df9-a69c-07b3f60060fc
Wang, Qianzhi
696b2954-9bbe-4e19-a9d2-22435e55d9b4
Yue, Bin
e33839b9-24f2-49ee-b31a-ffb62b0288d1
Wu, Xuemei
4689cce9-0f25-4497-9a2d-a3bb0a3e1f34
Zhuge, Lanjian
dbded7f6-052b-4db8-9501-53427d7551d6
Cheng, Xiaonong
dcfca852-12a9-4604-be17-1c52ba4bcb3f
Zhou, Fei, Wang, Qianzhi, Yue, Bin, Wu, Xuemei, Zhuge, Lanjian and Cheng, Xiaonong
(2013)
Mechanical properties and bonding structure of boron carbon nitride films synthesized by dual ion beam sputtering.
Materials Chemistry and Physics, 138 (1), .
(doi:10.1016/j.matchemphys.2012.11.049).
Abstract
The BCN films were synthesized on Si (110) wafers by using dual ion beam sputtering deposition from boron carbide target. The influences of ion assist source energy and N2 relative flow rate on the surface roughness, mechanical properties and chemical bonding structure of BCN films were investigated systematically. The surface roughness was measured using non-contact optical surface profilometer and the mechanical properties of BCN films were evaluated with nano-indenter. The BCN films were characterized by using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy and X-ray photoelectron spectroscopy (XPS), respectively. The results showed that the BCN films' surface roughness varied in the range of 5-15 nm, and their hardness and reduced elastic modulus fluctuated in the scope of 18-29 GPa and 192-229 GPa, respectively. When the BCN films' surface roughness varied in the range of 8-12 nm, the values of hardness and reduced elastic modulus were fluctuated slightly. The BCN films with the smoothest surface (Ra=5 nm) and the highest hardness of 28 GPa were obtained at the ion assist source energy of 200 eV and the N2 relative flow rate of 50%. The BCN films were amorphous and contained several bonding states such as B-N, B-C and C-N with B-C-N hybridization.
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Accepted/In Press date: 17 November 2012
Published date: 15 February 2013
Keywords:
thin films, sputtering, hardness, surfaces, microstructure
Organisations:
nCATS Group
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Local EPrints ID: 377170
URI: http://eprints.soton.ac.uk/id/eprint/377170
ISSN: 0254-0584
PURE UUID: 61cd7cbf-c042-4181-8f06-b284b13dbe77
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Date deposited: 01 Jun 2015 14:14
Last modified: 14 Mar 2024 19:57
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Author:
Fei Zhou
Author:
Qianzhi Wang
Author:
Bin Yue
Author:
Xuemei Wu
Author:
Lanjian Zhuge
Author:
Xiaonong Cheng
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