Electron backscatter diffraction (EBSD) microstructure evolution in HPT copper annealed at a low temperature
Electron backscatter diffraction (EBSD) microstructure evolution in HPT copper annealed at a low temperature
Detailed EBSD analysis was performed on copper specimens processed by high-pressure torsion at P = 6 GPa for one whole turn and subsequently annealed at a temperature of 100 °C for 15, 30 and 60 min. The basic microstructural parameters (mean grain size, GB statistics, microtexture) were evaluated in the mid-radius areas of the HPT disks. Microhardness of all samples was measured across the two diameters and interlinked to the microstructures observed. Small but noticeable changes of microhardness in HPT copper after annealing were detected. The changes were interlinked to microstructural parameters acquired by EBSD. The relationships obtained are discussed in terms of the microstructure and microtexture evolution during low temperature annealing.
hardness, high-pressure torsion, homogeneity, severe plastic deformation
338-343
Zhilyaev, Alexander P.
d053e518-1976-4633-8953-e8f34b9b7c44
Sergeev, Semyon N.
f007fda7-adc2-4435-aac3-116c906a6802
Langdon, Terence G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
October 2014
Zhilyaev, Alexander P.
d053e518-1976-4633-8953-e8f34b9b7c44
Sergeev, Semyon N.
f007fda7-adc2-4435-aac3-116c906a6802
Langdon, Terence G.
86e69b4f-e16d-4830-bf8a-5a9c11f0de86
Zhilyaev, Alexander P., Sergeev, Semyon N. and Langdon, Terence G.
(2014)
Electron backscatter diffraction (EBSD) microstructure evolution in HPT copper annealed at a low temperature.
Journal of Materials Research and Technology, 3 (4), .
(doi:10.1016/j.jmrt.2014.06.008).
Abstract
Detailed EBSD analysis was performed on copper specimens processed by high-pressure torsion at P = 6 GPa for one whole turn and subsequently annealed at a temperature of 100 °C for 15, 30 and 60 min. The basic microstructural parameters (mean grain size, GB statistics, microtexture) were evaluated in the mid-radius areas of the HPT disks. Microhardness of all samples was measured across the two diameters and interlinked to the microstructures observed. Small but noticeable changes of microhardness in HPT copper after annealing were detected. The changes were interlinked to microstructural parameters acquired by EBSD. The relationships obtained are discussed in terms of the microstructure and microtexture evolution during low temperature annealing.
This record has no associated files available for download.
More information
Accepted/In Press date: 25 June 2014
e-pub ahead of print date: 28 July 2014
Published date: October 2014
Keywords:
hardness, high-pressure torsion, homogeneity, severe plastic deformation
Organisations:
Engineering Mats & Surface Engineerg Gp
Identifiers
Local EPrints ID: 377247
URI: http://eprints.soton.ac.uk/id/eprint/377247
ISSN: 2238-7854
PURE UUID: 1fb56c00-1ddf-4f08-ab84-6bf71ecfa8f7
Catalogue record
Date deposited: 20 May 2015 11:29
Last modified: 15 Mar 2024 03:13
Export record
Altmetrics
Contributors
Author:
Alexander P. Zhilyaev
Author:
Semyon N. Sergeev
Download statistics
Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
View more statistics
