Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores

Tenentes, Vasileios, Kavousianos, X. and Kalligeros, E. (2010) Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 29 (10), 1640-1644. (doi:10.1109/TCAD.2010.2051096).

Record type: Article

Abstract

Even though test set embedding (TSE) methods offer very high compression efficiency, their excessively long test application times prohibit their use for testing systems-on-chip (SoC). To alleviate this problem we present two new types of linear feedback shift registers (LFSRs), the Single-State-Skip and the Variable-State-Skip LFSRs. Both are normal LFSRs with the addition of the State-Skip circuit, which is used instead of the characteristic-polynomial feedback structure for performing successive jumps of constant and variable length in their state sequence. By using Single-State-Skip LFSRs for testing single or multiple identical cores and Variable-State-Skip LFSRs for testing multiple non-identical cores we get the well-known high compression efficiency of TSE with substantially reduced test sequences, thus bridging the gap between test data compression and TSE methods.

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