Limitations and precision requirements for read-out of passive, linear, selectorless RRAM arrays
Limitations and precision requirements for read-out of passive, linear, selectorless RRAM arrays
A practical system for reading out from linear, multi-level, selectorless Resistive Random Access Memory (RRAM) arrays based on a Trans-Impedance Amplifier (TIA) approach is presented and studied. SPICE simulation of the core of the system is performed in order to extract predicted sensitivity to error factors such as non-zero TIA offsets and access resistance. A physical implementation of the system is then tested on a small, 12 × 12 reference array and measured results show its ability to decode absolute resistive states in the range of 1 kΩ-220 kΩ within ~ 11% tolerance.
189-192
Serb, A.
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Redman-White, W
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Papavassiliou, C.
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Berdan, R.
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Prodromakis, T.
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May 2015
Serb, A.
30f5ec26-f51d-42b3-85fd-0325a27a792c
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf
Papavassiliou, C.
5faf408a-ca30-47e5-8283-4a65536f91ff
Berdan, R.
082f1f5b-eaee-48a6-b728-414fc65f72bd
Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf
Serb, A., Redman-White, W, Papavassiliou, C., Berdan, R. and Prodromakis, T.
(2015)
Limitations and precision requirements for read-out of passive, linear, selectorless RRAM arrays.
IEEE International Symposium in Circuits and Systems (ISCAS 2015), Lisbon, Portugal.
24 - 27 May 2015.
.
(doi:10.1109/ISCAS.2015.7168602).
Record type:
Conference or Workshop Item
(Paper)
Abstract
A practical system for reading out from linear, multi-level, selectorless Resistive Random Access Memory (RRAM) arrays based on a Trans-Impedance Amplifier (TIA) approach is presented and studied. SPICE simulation of the core of the system is performed in order to extract predicted sensitivity to error factors such as non-zero TIA offsets and access resistance. A physical implementation of the system is then tested on a small, 12 × 12 reference array and measured results show its ability to decode absolute resistive states in the range of 1 kΩ-220 kΩ within ~ 11% tolerance.
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Published date: May 2015
Venue - Dates:
IEEE International Symposium in Circuits and Systems (ISCAS 2015), Lisbon, Portugal, 2015-05-24 - 2015-05-27
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 377547
URI: http://eprints.soton.ac.uk/id/eprint/377547
PURE UUID: 5d752dbf-9f8e-4334-a950-bd30a80e9246
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Date deposited: 09 Jun 2015 10:58
Last modified: 14 Mar 2024 20:05
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Contributors
Author:
A. Serb
Author:
W Redman-White
Author:
C. Papavassiliou
Author:
R. Berdan
Author:
T. Prodromakis
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