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Limitations and precision requirements for read-out of passive, linear, selectorless RRAM arrays

Limitations and precision requirements for read-out of passive, linear, selectorless RRAM arrays
Limitations and precision requirements for read-out of passive, linear, selectorless RRAM arrays
A practical system for reading out from linear, multi-level, selectorless Resistive Random Access Memory (RRAM) arrays based on a Trans-Impedance Amplifier (TIA) approach is presented and studied. SPICE simulation of the core of the system is performed in order to extract predicted sensitivity to error factors such as non-zero TIA offsets and access resistance. A physical implementation of the system is then tested on a small, 12 × 12 reference array and measured results show its ability to decode absolute resistive states in the range of 1 k?-220 k? within ? 11% tolerance.
189-192
Serb, A.
30f5ec26-f51d-42b3-85fd-0325a27a792c
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf
Papavassiliou, C.
5faf408a-ca30-47e5-8283-4a65536f91ff
Berdan, R.
082f1f5b-eaee-48a6-b728-414fc65f72bd
Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf
Serb, A.
30f5ec26-f51d-42b3-85fd-0325a27a792c
Redman-White, W
d5376167-c925-460f-8e9c-13bffda8e0bf
Papavassiliou, C.
5faf408a-ca30-47e5-8283-4a65536f91ff
Berdan, R.
082f1f5b-eaee-48a6-b728-414fc65f72bd
Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf

Serb, A., Redman-White, W, Papavassiliou, C., Berdan, R. and Prodromakis, T. (2015) Limitations and precision requirements for read-out of passive, linear, selectorless RRAM arrays. At IEEE International Symposium in Circuits and Systems (ISCAS 2015) IEEE International Symposium in Circuits and Systems (ISCAS 2015), Portugal. 24 - 27 May 2015. pp. 189-192. (doi:10.1109/ISCAS.2015.7168602).

Record type: Conference or Workshop Item (Paper)

Abstract

A practical system for reading out from linear, multi-level, selectorless Resistive Random Access Memory (RRAM) arrays based on a Trans-Impedance Amplifier (TIA) approach is presented and studied. SPICE simulation of the core of the system is performed in order to extract predicted sensitivity to error factors such as non-zero TIA offsets and access resistance. A physical implementation of the system is then tested on a small, 12 × 12 reference array and measured results show its ability to decode absolute resistive states in the range of 1 k?-220 k? within ? 11% tolerance.

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More information

Published date: May 2015
Venue - Dates: IEEE International Symposium in Circuits and Systems (ISCAS 2015), Portugal, 2015-05-24 - 2015-05-27
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 377547
URI: https://eprints.soton.ac.uk/id/eprint/377547
PURE UUID: 5d752dbf-9f8e-4334-a950-bd30a80e9246
ORCID for T. Prodromakis: ORCID iD orcid.org/0000-0002-6267-6909

Catalogue record

Date deposited: 09 Jun 2015 10:58
Last modified: 06 Jun 2018 12:24

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Contributors

Author: A. Serb
Author: W Redman-White
Author: C. Papavassiliou
Author: R. Berdan
Author: T. Prodromakis ORCID iD

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