Trapatseli, M., Carta, D., Regoutz, A., Khiat, A., Serb, Alexander, Gupta, I. and Prodromakis, T. (2015) Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films. International Workshop on Advances in ReRAM: Materials & Interfaces, Chania, Greece. 10 - 14 Oct 2015.
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Accepted/In Press date: May 2015
Published date: October 2015
Venue - Dates:
International Workshop on Advances in ReRAM: Materials & Interfaces, Chania, Greece, 2015-10-10 - 2015-10-14
Organisations:
Nanoelectronics and Nanotechnology
Identifiers
Local EPrints ID: 377550
URI: http://eprints.soton.ac.uk/id/eprint/377550
PURE UUID: 48ded834-ad2e-4fa8-abe4-fc4f88ec735a
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Date deposited: 09 Jun 2015 10:28
Last modified: 12 Dec 2021 04:00
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Contributors
Author:
M. Trapatseli
Author:
D. Carta
Author:
A. Regoutz
Author:
A. Khiat
Author:
Alexander Serb
Author:
I. Gupta
Author:
T. Prodromakis
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