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Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films

Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films
Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films
Trapatseli, M.
1aea9f6b-2790-48b4-85d5-e600e60f6406
Carta, D.
120de978-2aaa-4b4d-bf5f-3625c503040d
Regoutz, A.
f10acbf6-a56e-4193-88d5-5167f3ecb385
Khiat, A.
bf549ddd-5356-4a7d-9c12-eb6c0d904050
Serb, Alexander
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Gupta, I.
30097cf6-f819-4e86-8d92-6a2d1d1754c8
Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf
Trapatseli, M.
1aea9f6b-2790-48b4-85d5-e600e60f6406
Carta, D.
120de978-2aaa-4b4d-bf5f-3625c503040d
Regoutz, A.
f10acbf6-a56e-4193-88d5-5167f3ecb385
Khiat, A.
bf549ddd-5356-4a7d-9c12-eb6c0d904050
Serb, Alexander
30f5ec26-f51d-42b3-85fd-0325a27a792c
Gupta, I.
30097cf6-f819-4e86-8d92-6a2d1d1754c8
Prodromakis, T.
d58c9c10-9d25-4d22-b155-06c8437acfbf

Trapatseli, M., Carta, D., Regoutz, A., Khiat, A., Serb, Alexander, Gupta, I. and Prodromakis, T. (2015) Conductive atomic force microscopy investigation of switching thresholds in titanium dioxide thin films. International Workshop on Advances in ReRAM: Materials & Interfaces, Chania, Greece. 10 - 14 Oct 2015.

Record type: Conference or Workshop Item (Other)

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More information

Accepted/In Press date: May 2015
Published date: October 2015
Venue - Dates: International Workshop on Advances in ReRAM: Materials & Interfaces, Chania, Greece, 2015-10-10 - 2015-10-14
Organisations: Nanoelectronics and Nanotechnology

Identifiers

Local EPrints ID: 377550
URI: http://eprints.soton.ac.uk/id/eprint/377550
PURE UUID: 48ded834-ad2e-4fa8-abe4-fc4f88ec735a
ORCID for T. Prodromakis: ORCID iD orcid.org/0000-0002-6267-6909

Catalogue record

Date deposited: 09 Jun 2015 10:28
Last modified: 12 Dec 2021 04:00

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Contributors

Author: M. Trapatseli
Author: D. Carta
Author: A. Regoutz
Author: A. Khiat
Author: Alexander Serb
Author: I. Gupta
Author: T. Prodromakis ORCID iD

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