Electro-chemical degradation of thin film X2 safety capacitors
Electro-chemical degradation of thin film X2 safety capacitors
There is some field evidence that certain manufactured batches of thin film X2 capacitors are more susceptible to electro-chemical corrosion than others. Studies undertaken at the University of Leicester, City University London and the University of Southampton have investigated this degradation mechanism, developed underlying theory for this behaviour and validated the theory using data from damp heat testing. This paper details the anatomy of thin film X2 capacitors, details the principal mechanisms of degradation and breakdown before explaining the electrochemical corrosion mechanism and associated loss of capacitance. The effects of this degradation mechanism on other properties of the capacitor are shown to be minimal as evidenced by dielectric spectroscopy and other measurements. The ultimate conclusion is that unlike other types of capacitor, a pre-defined drop in initial capacitance does not signify end of useful life and for specific applications end of life of an X2 capacitor should be defined as the minimum value of X2 capacitance that will ensure reliable operation of a given circuit.
thin film capacitors, electrochemical degradation
978-1-4799-7354-5
98-101
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Fothergill, J.C.
30b3e741-3463-4cc0-9f74-f61a3ea75c8f
Dodd, S.J.
d8dc61a7-c718-4c26-b04b-b6107eed57a6
7 June 2015
Lewin, P.L.
78b4fc49-1cb3-4db9-ba90-3ae70c0f639e
Fothergill, J.C.
30b3e741-3463-4cc0-9f74-f61a3ea75c8f
Dodd, S.J.
d8dc61a7-c718-4c26-b04b-b6107eed57a6
Lewin, P.L., Fothergill, J.C. and Dodd, S.J.
(2015)
Electro-chemical degradation of thin film X2 safety capacitors.
2015 IEEE Electrical Insulation Conference (EIC), Seattle, United States.
07 - 10 Jun 2015.
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
There is some field evidence that certain manufactured batches of thin film X2 capacitors are more susceptible to electro-chemical corrosion than others. Studies undertaken at the University of Leicester, City University London and the University of Southampton have investigated this degradation mechanism, developed underlying theory for this behaviour and validated the theory using data from damp heat testing. This paper details the anatomy of thin film X2 capacitors, details the principal mechanisms of degradation and breakdown before explaining the electrochemical corrosion mechanism and associated loss of capacitance. The effects of this degradation mechanism on other properties of the capacitor are shown to be minimal as evidenced by dielectric spectroscopy and other measurements. The ultimate conclusion is that unlike other types of capacitor, a pre-defined drop in initial capacitance does not signify end of useful life and for specific applications end of life of an X2 capacitor should be defined as the minimum value of X2 capacitance that will ensure reliable operation of a given circuit.
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Published date: 7 June 2015
Venue - Dates:
2015 IEEE Electrical Insulation Conference (EIC), Seattle, United States, 2015-06-07 - 2015-06-10
Keywords:
thin film capacitors, electrochemical degradation
Organisations:
EEE
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Local EPrints ID: 378054
URI: http://eprints.soton.ac.uk/id/eprint/378054
ISBN: 978-1-4799-7354-5
PURE UUID: 27db5523-008e-4f21-bbff-69e6b4eac3ad
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Date deposited: 15 Jun 2015 14:04
Last modified: 15 Mar 2024 02:43
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Contributors
Author:
P.L. Lewin
Author:
J.C. Fothergill
Author:
S.J. Dodd
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