Investigation of the electrical and chemical processes causing the failure event in a Copper Sulfide related Transformer Failure
Investigation of the electrical and chemical processes causing the failure event in a Copper Sulfide related Transformer Failure
Copper sulfide related failures of oil-filled plants have become more common around most parts of the world over the last couple of decades, which has led the industry to re-evaluate their asset risk analysis policy for mineral oil insulated power assets. Two main theories for the failure event suggested by the current state-of-the-art are thermal runaway and turn-to-turn disk electrical breakdown.
Transformer, Transformer Failures, DP, Breakdown Strength, Copper Sulfide
392-396
Amaro, P S
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Facciotti, M
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Lewin, P L
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Pilgrim, J A
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Brown, R C D
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Wilson, G
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Jarman, P N
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7 June 2015
Amaro, P S
09096f1c-3840-48a7-a65d-d734ff70c88c
Facciotti, M
3c5dd179-8124-4d79-99b2-faa2aa37e96f
Lewin, P L
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Pilgrim, J A
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Brown, R C D
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Wilson, G
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Jarman, P N
8e6247bc-f98c-4dac-b150-b7213f2184d5
Amaro, P S, Facciotti, M, Lewin, P L, Pilgrim, J A, Brown, R C D, Wilson, G and Jarman, P N
(2015)
Investigation of the electrical and chemical processes causing the failure event in a Copper Sulfide related Transformer Failure.
IEEE 2015 Electrical Insulation Conference (EIC), Seattle, United States.
07 - 10 Jun 2015.
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Copper sulfide related failures of oil-filled plants have become more common around most parts of the world over the last couple of decades, which has led the industry to re-evaluate their asset risk analysis policy for mineral oil insulated power assets. Two main theories for the failure event suggested by the current state-of-the-art are thermal runaway and turn-to-turn disk electrical breakdown.
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Published date: 7 June 2015
Venue - Dates:
IEEE 2015 Electrical Insulation Conference (EIC), Seattle, United States, 2015-06-07 - 2015-06-10
Keywords:
Transformer, Transformer Failures, DP, Breakdown Strength, Copper Sulfide
Organisations:
EEE
Identifiers
Local EPrints ID: 378093
URI: http://eprints.soton.ac.uk/id/eprint/378093
PURE UUID: 3ef2e8f2-0c5f-4180-8907-f0308afe72ef
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Date deposited: 16 Jun 2015 11:31
Last modified: 15 Mar 2024 03:25
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Contributors
Author:
P S Amaro
Author:
M Facciotti
Author:
P L Lewin
Author:
J A Pilgrim
Author:
R C D Brown
Author:
G Wilson
Author:
P N Jarman
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