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DFT architecture with power-distribution-network consideration for delay-based power gating test

DFT architecture with power-distribution-network consideration for delay-based power gating test
DFT architecture with power-distribution-network consideration for delay-based power gating test
This paper shows that existing delay-based testing techniques for power gating exhibit both fault coverage and yield loss due to deviations at the charging delay introduced by the distributed nature of the power-distribution-networks (PDNs). To restore this test quality loss, which could reach up to 67.7% of false passes and 25% of false fails due to stuck-open faults, we propose a design-for-testability (DFT) logic that accounts for a distributed PDN. The proposed logic is optimized by an algorithm that also handles uncertainty due to process variations and offers trade-off flexibility between test-application-time and area cost. A calibration process is proposed to bridge model-to-hardware discrepancies and increase test quality when considering systematic variations. Through SPICE simulations, we show complete recovery of the test quality lost due to PDNs. The proposed method is robust sustaining 80.3% to 98.6% of the achieved test quality under high random and systematic process variations. To the best of our knowledge, this paper presents the first analysis of the PDN impact on test quality and offers a unified test solution for both ring and grid power gating styles.
power gating, dft, power-distribution-network, test quality, grid style, ring style, systematic variations
1-12
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39
Khursheed, Saqib
0c4e3d52-0df5-43d9-bafe-d2eaea457506
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Yang, Sheng
04b9848f-ddd4-4d8f-93b6-b91a2144d49c
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d
Tenentes, Vasileios
1bff9ebc-9186-438b-850e-6c738994fa39
Khursheed, Saqib
0c4e3d52-0df5-43d9-bafe-d2eaea457506
Rossi, Daniele
30c42382-cf0a-447d-8695-fa229b7b8a2f
Yang, Sheng
04b9848f-ddd4-4d8f-93b6-b91a2144d49c
Al-Hashimi, Bashir M.
0b29c671-a6d2-459c-af68-c4614dce3b5d

Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M. (2015) DFT architecture with power-distribution-network consideration for delay-based power gating test. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1-12. (doi:10.1109/TCAD.2015.2446939).

Record type: Article

Abstract

This paper shows that existing delay-based testing techniques for power gating exhibit both fault coverage and yield loss due to deviations at the charging delay introduced by the distributed nature of the power-distribution-networks (PDNs). To restore this test quality loss, which could reach up to 67.7% of false passes and 25% of false fails due to stuck-open faults, we propose a design-for-testability (DFT) logic that accounts for a distributed PDN. The proposed logic is optimized by an algorithm that also handles uncertainty due to process variations and offers trade-off flexibility between test-application-time and area cost. A calibration process is proposed to bridge model-to-hardware discrepancies and increase test quality when considering systematic variations. Through SPICE simulations, we show complete recovery of the test quality lost due to PDNs. The proposed method is robust sustaining 80.3% to 98.6% of the achieved test quality under high random and systematic process variations. To the best of our knowledge, this paper presents the first analysis of the PDN impact on test quality and offers a unified test solution for both ring and grid power gating styles.

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More information

Accepted/In Press date: 1 June 2015
Published date: 18 June 2015
Keywords: power gating, dft, power-distribution-network, test quality, grid style, ring style, systematic variations
Organisations: Electronic & Software Systems

Identifiers

Local EPrints ID: 378304
URI: http://eprints.soton.ac.uk/id/eprint/378304
PURE UUID: ad925a4a-2675-40e0-91ca-e322c9e6c6f8

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Date deposited: 01 Jul 2015 11:08
Last modified: 07 Jan 2022 21:41

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Contributors

Author: Vasileios Tenentes
Author: Saqib Khursheed
Author: Daniele Rossi
Author: Sheng Yang
Author: Bashir M. Al-Hashimi

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