Tip-enhanced Raman spectroscopy for suspended graphene integrated with silicon nanowire array
Tip-enhanced Raman spectroscopy for suspended graphene integrated with silicon nanowire array
Local chemical and mechanical properties of suspended graphene structure integrated with an array of slicon nanowires (SiNW) are investigated by employing Tip-Enhanced Raman Spectroscopy (TERS). Clear difference in the shift of the major graphene peak positions is observed between Raman spectra without the tip and TERS spectra across the graphene located on the edge of the SiNW underneath. Localised defects that might be induced by the graphene transfer on the array are identified with the spatial resolution of approximately 100nm by the analysis of the peak intensity ratio. The results suggest that TERS is a promising technology for further improvement of graphene-based nanoelectromechanical device fabrication processes.
Nagahisa, Y.
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Zelai, T.
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Reynords, J.
68e8dfd6-eab1-48fe-8069-b27c5ceab39a
Boodhoo, L.
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Huang, C.C.
825f7447-6d02-48f6-b95a-fa33da71f106
Hewak, D.W.
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Tokumitsu, E.
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Mizuta, H.
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Tsuchiya, Y.
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2015
Nagahisa, Y.
86e5a075-9dec-4cd7-92b6-9e5c09f3cea2
Zelai, T.
f6d2a510-3671-4ca7-81ff-30d31926798a
Reynords, J.
68e8dfd6-eab1-48fe-8069-b27c5ceab39a
Boodhoo, L.
3cb5f3c0-0c1f-4d33-93c4-5c75518e1129
Huang, C.C.
825f7447-6d02-48f6-b95a-fa33da71f106
Hewak, D.W.
87c80070-c101-4f7a-914f-4cc3131e3db0
Tokumitsu, E.
f1a6748d-f792-4e9c-80c4-ddf46a224189
Mizuta, H.
c03e841e-f9cf-4f99-99a0-2a9261fb1345
Tsuchiya, Y.
5e34980d-9e33-4a73-b3be-e8fe2ca71336
Nagahisa, Y., Zelai, T., Reynords, J., Boodhoo, L., Huang, C.C., Hewak, D.W., Tokumitsu, E., Mizuta, H. and Tsuchiya, Y.
(2015)
Tip-enhanced Raman spectroscopy for suspended graphene integrated with silicon nanowire array.
The Microscience Microscopy Congress '15, Manchester, United Kingdom.
29 Jun - 02 Jul 2015.
4 pp
.
Record type:
Conference or Workshop Item
(Paper)
Abstract
Local chemical and mechanical properties of suspended graphene structure integrated with an array of slicon nanowires (SiNW) are investigated by employing Tip-Enhanced Raman Spectroscopy (TERS). Clear difference in the shift of the major graphene peak positions is observed between Raman spectra without the tip and TERS spectra across the graphene located on the edge of the SiNW underneath. Localised defects that might be induced by the graphene transfer on the array are identified with the spatial resolution of approximately 100nm by the analysis of the peak intensity ratio. The results suggest that TERS is a promising technology for further improvement of graphene-based nanoelectromechanical device fabrication processes.
More information
Published date: 2015
Venue - Dates:
The Microscience Microscopy Congress '15, Manchester, United Kingdom, 2015-06-29 - 2015-07-02
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 379619
URI: http://eprints.soton.ac.uk/id/eprint/379619
PURE UUID: 155ac42e-14a7-427a-b6af-0a2a3b01e50e
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Date deposited: 30 Jul 2015 13:08
Last modified: 15 Mar 2024 03:23
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Contributors
Author:
Y. Nagahisa
Author:
T. Zelai
Author:
J. Reynords
Author:
L. Boodhoo
Author:
E. Tokumitsu
Author:
H. Mizuta
Author:
Y. Tsuchiya
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