Analysis of the Reliability of Comparator circuits
Analysis of the Reliability of Comparator circuits
The lack of study on analogue circuits reliability is likely due to the migration of analogue circuits to their digital equivalents. There are a considerable numbers of important analogue circuits such as amplifiers and comparators used in sensors in portable devices, which may be investigated on its reliability. The small number of investigations on analogue circuit's reliability has initiated the interest in investigating the impact of single event transients or soft errors for analogue circuits. Sensitivity analysis was performed to determine the sensitive parts of the circuit. The sensitivity analysis have indicated that single event transient has lead to erroneous behavior of comparators and eventually cause failure. The sensitive sub-circuits were later investigated on its dependence on variability of the design variables which covers both process and environment parameters. The variability analysis has proven that it does contribute towards increasing the sensitivity of the comparator to single event transients. Variability has also proven that it could increase the vulnerability of the least sensitive parts of the comparator.
Nawi, Illani Mohd
d9576d92-d667-4dae-a7ec-6bfa9bed2b3e
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
June 2015
Nawi, Illani Mohd
d9576d92-d667-4dae-a7ec-6bfa9bed2b3e
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
Nawi, Illani Mohd, Halak, Basel and Zwolinski, Mark
(2015)
Analysis of the Reliability of Comparator circuits.
IEEE PRIME, Glasgow City, United Kingdom.
Record type:
Conference or Workshop Item
(Paper)
Abstract
The lack of study on analogue circuits reliability is likely due to the migration of analogue circuits to their digital equivalents. There are a considerable numbers of important analogue circuits such as amplifiers and comparators used in sensors in portable devices, which may be investigated on its reliability. The small number of investigations on analogue circuit's reliability has initiated the interest in investigating the impact of single event transients or soft errors for analogue circuits. Sensitivity analysis was performed to determine the sensitive parts of the circuit. The sensitivity analysis have indicated that single event transient has lead to erroneous behavior of comparators and eventually cause failure. The sensitive sub-circuits were later investigated on its dependence on variability of the design variables which covers both process and environment parameters. The variability analysis has proven that it does contribute towards increasing the sensitivity of the comparator to single event transients. Variability has also proven that it could increase the vulnerability of the least sensitive parts of the comparator.
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Published date: June 2015
Venue - Dates:
IEEE PRIME, Glasgow City, United Kingdom, 2015-05-31
Organisations:
EEE
Identifiers
Local EPrints ID: 379688
URI: http://eprints.soton.ac.uk/id/eprint/379688
PURE UUID: 45ff4821-b4c8-45c9-b6a6-85a9231146ee
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Date deposited: 27 Jul 2015 12:58
Last modified: 12 Dec 2021 03:51
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Contributors
Author:
Illani Mohd Nawi
Author:
Basel Halak
Author:
Mark Zwolinski
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