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Analysis of the Reliability of Comparator circuits

Nawi, Illani Mohd, Halak, Basel and Zwolinski, Mark (2015) Analysis of the Reliability of Comparator circuits At IEEE PRIME, United Kingdom.

Record type: Conference or Workshop Item (Paper)


The lack of study on analogue circuits reliability is likely due to the migration of analogue circuits to their digital equivalents. There are a considerable numbers of important analogue circuits such as amplifiers and comparators used in sensors in portable devices, which may be investigated on its reliability. The small number of investigations on analogue circuit's reliability has initiated the interest in investigating the impact of single event transients or soft errors for analogue circuits. Sensitivity analysis was performed to determine the sensitive parts of the circuit. The sensitivity analysis have indicated that single event transient has lead to erroneous behavior of comparators and eventually cause failure. The sensitive sub-circuits were later investigated on its dependence on variability of the design variables which covers both process and environment parameters. The variability analysis has proven that it does contribute towards increasing the sensitivity of the comparator to single event transients. Variability has also proven that it could increase the vulnerability of the least sensitive parts of the comparator.

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Published date: June 2015
Venue - Dates: IEEE PRIME, United Kingdom, 2015-06-01
Organisations: EEE


Local EPrints ID: 379688
PURE UUID: 45ff4821-b4c8-45c9-b6a6-85a9231146ee
ORCID for Mark Zwolinski: ORCID iD

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Date deposited: 27 Jul 2015 12:58
Last modified: 17 Jul 2017 20:41

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Author: Illani Mohd Nawi
Author: Basel Halak
Author: Mark Zwolinski ORCID iD

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