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TCO-PUF: A Subthreshold Physical Unclonable Function

TCO-PUF: A Subthreshold Physical Unclonable Function
TCO-PUF: A Subthreshold Physical Unclonable Function
Physical Unclonable Functions (PUF) is a promising
technology towards a comprehensive security protection for integrated circuits application. Its provide a secure method of hardware identification and authentication by exploiting inherent manufacturing process variations to generate a unique response. However, most of the proposed PUFs have been shown to be vulnerable to the attacks especially machine learning (ML) based modeling attack. This defeat the purpose of the PUF itself
which supposed to be reliable and secure. In this paper, a new
architecture of PUF which based on non-linearity dependence of
current and voltage behavior of MOSFET in sub-threshold region
is proposed. The fundamental idea is to exploit the Random
Dopant Fluctuation (RDF) effect to induce the threshold voltage
variations in the transistor operated in sub-threshold region. As
the threshold voltage varies, strong non-linearity is introduced
into the challenge-response relationship. The proposed PUF shows
excellent quality properties. The average inter-chip hamming
distance is 50.23%. The reliability over the temperature and
?10% supply voltage fluctuations is 91.58%.
MISPAN, Mohd Syafiq
1213c616-83bc-4223-8de3-72e259d62cce
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Chen, Zufu
ced98b96-ccc7-497b-a351-3529f4038473
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0
MISPAN, Mohd Syafiq
1213c616-83bc-4223-8de3-72e259d62cce
Halak, Basel
8221f839-0dfd-4f81-9865-37def5f79f33
Chen, Zufu
ced98b96-ccc7-497b-a351-3529f4038473
Zwolinski, Mark
adfcb8e7-877f-4bd7-9b55-7553b6cb3ea0

MISPAN, Mohd Syafiq, Halak, Basel, Chen, Zufu and Zwolinski, Mark (2015) TCO-PUF: A Subthreshold Physical Unclonable Function At IEEE PRIME, United Kingdom.

Record type: Conference or Workshop Item (Paper)

Abstract

Physical Unclonable Functions (PUF) is a promising
technology towards a comprehensive security protection for integrated circuits application. Its provide a secure method of hardware identification and authentication by exploiting inherent manufacturing process variations to generate a unique response. However, most of the proposed PUFs have been shown to be vulnerable to the attacks especially machine learning (ML) based modeling attack. This defeat the purpose of the PUF itself
which supposed to be reliable and secure. In this paper, a new
architecture of PUF which based on non-linearity dependence of
current and voltage behavior of MOSFET in sub-threshold region
is proposed. The fundamental idea is to exploit the Random
Dopant Fluctuation (RDF) effect to induce the threshold voltage
variations in the transistor operated in sub-threshold region. As
the threshold voltage varies, strong non-linearity is introduced
into the challenge-response relationship. The proposed PUF shows
excellent quality properties. The average inter-chip hamming
distance is 50.23%. The reliability over the temperature and
?10% supply voltage fluctuations is 91.58%.

Full text not available from this repository.

More information

Published date: June 2015
Venue - Dates: IEEE PRIME, United Kingdom, 2015-06-01
Organisations: EEE

Identifiers

Local EPrints ID: 379689
URI: http://eprints.soton.ac.uk/id/eprint/379689
PURE UUID: 0d8cca94-7b45-4a67-9dad-6a946eeb8ed3
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 27 Jul 2015 13:07
Last modified: 17 Jul 2017 20:41

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Contributors

Author: Mohd Syafiq MISPAN
Author: Basel Halak
Author: Zufu Chen
Author: Mark Zwolinski ORCID iD

University divisions

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