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An Application-Specific NBTI Ageing Analysis Method

Abbas, Haider, Halak, Basel and Zwolinski, Mark (2015) An Application-Specific NBTI Ageing Analysis Method At International Workshop on CMOS Variability, Brazil.

Record type: Conference or Workshop Item (Paper)

Abstract

There is growing concern about time-dependent
performance variations of CMOS devices due to ageing-induced
delay degradation. One of the main causes of ageing is Negative
Bias Temperature Instability (NBTI). Existing models which
predict the impact of NBTI on overall system performance
assume a generic switching activity of input signals of 50 percent.
Such an assumption can cause misleading predictions about
how a circuit’s performance will degrade over time and more
importantly which parts of the system will be most affected. This
work develops a novel NBTI ageing analysis which is based on
accurate calculations of the switching activity for applicationspecific
systems. The proposed method is employed to predict
the ageing of an ARM processor synthesised to 90nm technology.
Our results show the proposed ageing analysis techniques can
significantly reduce prediction errors (e.g. 39% for one of the
critical paths) compared to the generic models, it can also identify
more accurately the parts of the system which are most vulnerable
to ageing.

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More information

Published date: September 2015
Venue - Dates: International Workshop on CMOS Variability, Brazil, 2015-09-01
Organisations: EEE

Identifiers

Local EPrints ID: 379694
URI: http://eprints.soton.ac.uk/id/eprint/379694
PURE UUID: bce7d8d3-2904-4c89-bb6f-bd248bd5f31f
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 27 Jul 2015 13:23
Last modified: 17 Jul 2017 20:41

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Contributors

Author: Haider Abbas
Author: Basel Halak
Author: Mark Zwolinski ORCID iD

University divisions

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