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The contact resistance force relationship of an intrinsically conducting polymer interface

The contact resistance force relationship of an intrinsically conducting polymer interface
The contact resistance force relationship of an intrinsically conducting polymer interface
Investigations on contact connector materials for different applications such as in the automotive industry have focused toward the increasing interest of using conducting polymers, as compared to conventional metallic contacts. The aim is to achieve overall improvements in performance as well as cost effectiveness. Currently, extrinsic conducting polymers (ECPs) are employed as conductive coats or adhesives at contact interfaces. However, frictional abrasion within the metal doped polymer (ECP) causes fretting corrosion, which leads to instability in the contact resistance. To overcome this, intrinsically conducting polymers (ICPs) are explored. Hemispherical contact coatings were fabricated using poly(3,4-ethylenedioxythiopene) (PEDOT) or polyaniline/polyvinylchloride (PANI/PVC) commodity blends. Contact resistances were taken using four-wire resistance measurement techniques. The conductivities of in-house fabricated ICP contacts were found to be in the range of 10 2 S cm 1. The response relating the change of contact resistance under varying compression force appeared to be repeatable with minimum deviation of 2%. The surface profiles of the ICP contacts were also recorded by an optical confocal system. The initial investigation results presented in this paper were used to evaluate and validate the hypothesis of employing ICP contacts to eliminate or minimize wearing and fretting effects.
contact connector, contact resistance, fretting, intrinsically conducting polymer (icp), surface profile
1521-3331
294-302
Lam, Yu-Zhi
2a996163-eec3-478b-8298-002f33cb719f
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770
Lam, Yu-Zhi
2a996163-eec3-478b-8298-002f33cb719f
Swingler, J.
c6e2a49e-fadd-4f38-99f7-0ee1e2c92fac
McBride, J.W.
d9429c29-9361-4747-9ba3-376297cb8770

Lam, Yu-Zhi, Swingler, J. and McBride, J.W. (2006) The contact resistance force relationship of an intrinsically conducting polymer interface. IEEE Transactions on Components and Packaging Technologies, 29 (2), 294-302. (doi:10.1109/TCAPT.2006.875903).

Record type: Article

Abstract

Investigations on contact connector materials for different applications such as in the automotive industry have focused toward the increasing interest of using conducting polymers, as compared to conventional metallic contacts. The aim is to achieve overall improvements in performance as well as cost effectiveness. Currently, extrinsic conducting polymers (ECPs) are employed as conductive coats or adhesives at contact interfaces. However, frictional abrasion within the metal doped polymer (ECP) causes fretting corrosion, which leads to instability in the contact resistance. To overcome this, intrinsically conducting polymers (ICPs) are explored. Hemispherical contact coatings were fabricated using poly(3,4-ethylenedioxythiopene) (PEDOT) or polyaniline/polyvinylchloride (PANI/PVC) commodity blends. Contact resistances were taken using four-wire resistance measurement techniques. The conductivities of in-house fabricated ICP contacts were found to be in the range of 10 2 S cm 1. The response relating the change of contact resistance under varying compression force appeared to be repeatable with minimum deviation of 2%. The surface profiles of the ICP contacts were also recorded by an optical confocal system. The initial investigation results presented in this paper were used to evaluate and validate the hypothesis of employing ICP contacts to eliminate or minimize wearing and fretting effects.

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e-pub ahead of print date: 30 May 2006
Keywords: contact connector, contact resistance, fretting, intrinsically conducting polymer (icp), surface profile

Identifiers

Local EPrints ID: 38168
URI: http://eprints.soton.ac.uk/id/eprint/38168
ISSN: 1521-3331
PURE UUID: 0af749e4-9d9d-4a3b-8926-2ce7b6c0219d
ORCID for J.W. McBride: ORCID iD orcid.org/0000-0002-3024-0326

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Date deposited: 05 Jun 2006
Last modified: 16 Mar 2024 02:37

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Contributors

Author: Yu-Zhi Lam
Author: J. Swingler
Author: J.W. McBride ORCID iD

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