Nanoscale imaging and diffraction with ultrafast XUV radiation
Nanoscale imaging and diffraction with ultrafast XUV radiation
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
March 2010
Brocklesby, W.S.
c53ca2f6-db65-4e19-ad00-eebeb2e6de67
Brocklesby, W.S.
(2010)
Nanoscale imaging and diffraction with ultrafast XUV radiation.
Progress in Electromagnetics Research Symposium (PIERS 2010), Xian, China.
22 - 26 Mar 2010.
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Conference or Workshop Item
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Published date: March 2010
Venue - Dates:
Progress in Electromagnetics Research Symposium (PIERS 2010), Xian, China, 2010-03-22 - 2010-03-26
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 382450
URI: http://eprints.soton.ac.uk/id/eprint/382450
PURE UUID: 5843dab1-a471-4098-a407-7a00a7ab6c2d
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Date deposited: 06 Oct 2015 15:50
Last modified: 12 Dec 2021 02:40
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