Topley, R.P., Loiacono, R., Mashanovich, G.Z., Gwilliam, R.M., Henley, S.J., Lulli, G., Feldesh, R., Jones, R. and Reed, G.T. (2012) Post testing removal of amorphous silicon Bragg gratings. EOS Annual Meeting, , Aberdeen, United Kingdom. 24 - 27 Sep 2012.
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Conference or Workshop Item
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Published date: September 2012
Venue - Dates:
EOS Annual Meeting, , Aberdeen, United Kingdom, 2012-09-24 - 2012-09-27
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 382792
URI: http://eprints.soton.ac.uk/id/eprint/382792
PURE UUID: 71424578-08f9-47f7-9109-24cf7a7c5c72
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Date deposited: 21 Oct 2015 15:57
Last modified: 29 Oct 2024 02:45
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Contributors
Author:
R.P. Topley
Author:
R. Loiacono
Author:
G.Z. Mashanovich
Author:
R.M. Gwilliam
Author:
S.J. Henley
Author:
G. Lulli
Author:
R. Feldesh
Author:
R. Jones
Author:
G.T. Reed
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