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Space charge in nanodielectrics and its impact on electrical performance

Space charge in nanodielectrics and its impact on electrical performance
Space charge in nanodielectrics and its impact on electrical performance
Nanodielectrics have been actively investigated in last two decades as they have shown some improved dielectric properties that are important for high voltage insulation applications. One of these improvements is the reduction in space charge when the nanodielectrics are subjected to dc electric fields. One of the explanations is the formation of deep trap after introducing nanoparticles in the material. However, the mechanisms that are responsible for the charge suppression are not detailed. More importantly, the effect of charge suppression is strongly dependent on the amount of nanoparticles, i.e. loading concentration. In the present paper, a schematic model has been proposed based on deep trap concept. A tunneling process has been introduced when the trapping sites become closer which is the case for high nanofillers concentration. Based on the new model, charge formation and dynamics in nanodielectrics with different loading concentrations can be estimated and electrical performance anticipated. A range of factors that can influence charge trapping/detrapping have been discussed using the new model.
978-1-4799-8903-4
36-39
Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Li, Shengtao
e2d199c9-1c0c-40c8-aefb-ff3b3d8e4799
Zhong, Lisheng
255706e0-8092-4cac-a05b-94167a66729a
Chen, George
3de45a9c-6c9a-4bcb-90c3-d7e26be21819
Li, Shengtao
e2d199c9-1c0c-40c8-aefb-ff3b3d8e4799
Zhong, Lisheng
255706e0-8092-4cac-a05b-94167a66729a

Chen, George, Li, Shengtao and Zhong, Lisheng (2015) Space charge in nanodielectrics and its impact on electrical performance. IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, Australia. 19 - 22 Jul 2015. pp. 36-39 .

Record type: Conference or Workshop Item (Paper)

Abstract

Nanodielectrics have been actively investigated in last two decades as they have shown some improved dielectric properties that are important for high voltage insulation applications. One of these improvements is the reduction in space charge when the nanodielectrics are subjected to dc electric fields. One of the explanations is the formation of deep trap after introducing nanoparticles in the material. However, the mechanisms that are responsible for the charge suppression are not detailed. More importantly, the effect of charge suppression is strongly dependent on the amount of nanoparticles, i.e. loading concentration. In the present paper, a schematic model has been proposed based on deep trap concept. A tunneling process has been introduced when the trapping sites become closer which is the case for high nanofillers concentration. Based on the new model, charge formation and dynamics in nanodielectrics with different loading concentrations can be estimated and electrical performance anticipated. A range of factors that can influence charge trapping/detrapping have been discussed using the new model.

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Published date: 19 July 2015
Venue - Dates: IEEE 11th International Conference on the Properties and Applications of Dielectric Materials, Australia, 2015-07-19 - 2015-07-22
Organisations: EEE

Identifiers

Local EPrints ID: 383665
URI: https://eprints.soton.ac.uk/id/eprint/383665
ISBN: 978-1-4799-8903-4
PURE UUID: 12974f2f-80a0-4bba-a52c-5b2423b678ac

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Date deposited: 17 Nov 2015 17:08
Last modified: 30 Jul 2019 18:32

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Contributors

Author: George Chen
Author: Shengtao Li
Author: Lisheng Zhong

University divisions

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