Deep-UV fluorescence lifetime imaging microscopy
Deep-UV fluorescence lifetime imaging microscopy
A novel fluorescence lifetime imaging microscopy (FLIM) working with deep UV 240-280 nm wavelength excitations has been developed. UV-FLIM is used for measurement of defect-related fluorescence and its changes upon annealing from femtosecond laser-induced modifications in fused silica. This FLIM technique can be used with microfluidic and biosamples to characterize temporal characteristics of fluorescence upon UV excitation, a capability easily added to a standard microscope-based FLIM. UV-FLIM was tested to show annealing of the defects induced by silica structuring with ultrashort laser pulses. Frequency-domain fluorescence measurements were converted into the time domain to extract long fluorescence lifetimes from defects in silica.
283
de Jong, Christiaan J.
7054e684-b088-4625-b5f0-1fa29229e2e2
Lajevardipour, Alireza
71d2ca77-bf67-4f7b-a852-d4ef14640d62
Gecevičius, Mindaugas
271576ee-dd9d-40b3-ab2f-19686b91dc64
Beresna, Martynas
a6dc062e-93c6-46a5-aeb3-8de332cdec7b
Gervinskas, Gediminas
7ed777ae-2369-48c5-92ef-1e8b7abaee3b
Kazansky, Peter G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
Bellouard, Yves
50467062-29d4-4f06-a65c-7ef44d183550
Clayton, Andrew H.A.
42987b51-5dbf-4478-bca3-b3d05f66fc79
Juodkazis, Saulius
1204b9c5-5339-4e78-af5a-6315a7b399e9
2015
de Jong, Christiaan J.
7054e684-b088-4625-b5f0-1fa29229e2e2
Lajevardipour, Alireza
71d2ca77-bf67-4f7b-a852-d4ef14640d62
Gecevičius, Mindaugas
271576ee-dd9d-40b3-ab2f-19686b91dc64
Beresna, Martynas
a6dc062e-93c6-46a5-aeb3-8de332cdec7b
Gervinskas, Gediminas
7ed777ae-2369-48c5-92ef-1e8b7abaee3b
Kazansky, Peter G.
a5d123ec-8ea8-408c-8963-4a6d921fd76c
Bellouard, Yves
50467062-29d4-4f06-a65c-7ef44d183550
Clayton, Andrew H.A.
42987b51-5dbf-4478-bca3-b3d05f66fc79
Juodkazis, Saulius
1204b9c5-5339-4e78-af5a-6315a7b399e9
de Jong, Christiaan J., Lajevardipour, Alireza, Gecevičius, Mindaugas, Beresna, Martynas, Gervinskas, Gediminas, Kazansky, Peter G., Bellouard, Yves, Clayton, Andrew H.A. and Juodkazis, Saulius
(2015)
Deep-UV fluorescence lifetime imaging microscopy.
Photonics Research, 3 (5), .
(doi:10.1364/PRJ.3.000283).
Abstract
A novel fluorescence lifetime imaging microscopy (FLIM) working with deep UV 240-280 nm wavelength excitations has been developed. UV-FLIM is used for measurement of defect-related fluorescence and its changes upon annealing from femtosecond laser-induced modifications in fused silica. This FLIM technique can be used with microfluidic and biosamples to characterize temporal characteristics of fluorescence upon UV excitation, a capability easily added to a standard microscope-based FLIM. UV-FLIM was tested to show annealing of the defects induced by silica structuring with ultrashort laser pulses. Frequency-domain fluorescence measurements were converted into the time domain to extract long fluorescence lifetimes from defects in silica.
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More information
Published date: 2015
Organisations:
Optoelectronics Research Centre
Identifiers
Local EPrints ID: 384292
URI: http://eprints.soton.ac.uk/id/eprint/384292
PURE UUID: 5c7c26ed-eb77-4307-802c-23452ff7ca93
Catalogue record
Date deposited: 01 Dec 2015 14:49
Last modified: 14 Mar 2024 21:56
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Contributors
Author:
Christiaan J. de Jong
Author:
Alireza Lajevardipour
Author:
Mindaugas Gecevičius
Author:
Martynas Beresna
Author:
Gediminas Gervinskas
Author:
Peter G. Kazansky
Author:
Yves Bellouard
Author:
Andrew H.A. Clayton
Author:
Saulius Juodkazis
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