Fractional Talbot lithography with extreme ultraviolet light
Fractional Talbot lithography with extreme ultraviolet light
 
  Fractional Talbot effect leads to the possibility to implement patterning of structures with smaller periods than the master mask. This is particularly attractive when using short wavelength illumination in the extreme ultraviolet because of attainable resolution in the sub-100-nm range. In this Letter, we demonstrate the Talbot lithography with the fractional Talbot effect under coherent illumination generated with a capillary discharge Ne-like Ar extreme ultraviolet laser. Various spatial frequency multiplications up to 5x are achieved using a parent grating. This technique allows a fabrication of nanostructures with high-resolution patterns, which is of high interest in many applications such as the manufacturing of plasmonic surfaces and photonic devices.
  
  
  6969-6972
  
    
      Kim, Hyun-su
      
        39359bf5-7ed4-4524-ba57-f8ce78468b5a
      
     
  
    
      Li, Wei
      
        ab5e097b-b347-4edf-95dd-2b245edf0f81
      
     
  
    
      Danylyuk, Serhiy
      
        10b87022-5625-40ff-b494-2c4bb6fe5a51
      
     
  
    
      Brocklesby, William S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
    
      Marconi, Mario C.
      
        02b0a766-aabe-4965-870b-f075c3efd6ac
      
     
  
    
      Juschkin, Larissa
      
        14157640-798a-4f51-ad7b-412ea6ddccb4
      
     
  
  
   
  
  
    
    
  
    
    
  
    
      15 December 2014
    
    
  
  
    
      Kim, Hyun-su
      
        39359bf5-7ed4-4524-ba57-f8ce78468b5a
      
     
  
    
      Li, Wei
      
        ab5e097b-b347-4edf-95dd-2b245edf0f81
      
     
  
    
      Danylyuk, Serhiy
      
        10b87022-5625-40ff-b494-2c4bb6fe5a51
      
     
  
    
      Brocklesby, William S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
    
      Marconi, Mario C.
      
        02b0a766-aabe-4965-870b-f075c3efd6ac
      
     
  
    
      Juschkin, Larissa
      
        14157640-798a-4f51-ad7b-412ea6ddccb4
      
     
  
       
    
 
  
    
      
  
  
  
  
  
  
    Kim, Hyun-su, Li, Wei, Danylyuk, Serhiy, Brocklesby, William S., Marconi, Mario C. and Juschkin, Larissa
  
  
  
  
   
    (2014)
  
  
    
    Fractional Talbot lithography with extreme ultraviolet light.
  
  
  
  
    Optics Letters, 39 (24), .
  
   (doi:10.1364/OL.39.006969). 
  
  
   
  
  
  
  
  
   
  
    
      
        
          Abstract
          Fractional Talbot effect leads to the possibility to implement patterning of structures with smaller periods than the master mask. This is particularly attractive when using short wavelength illumination in the extreme ultraviolet because of attainable resolution in the sub-100-nm range. In this Letter, we demonstrate the Talbot lithography with the fractional Talbot effect under coherent illumination generated with a capillary discharge Ne-like Ar extreme ultraviolet laser. Various spatial frequency multiplications up to 5x are achieved using a parent grating. This technique allows a fabrication of nanostructures with high-resolution patterns, which is of high interest in many applications such as the manufacturing of plasmonic surfaces and photonic devices.
        
        This record has no associated files available for download.
       
    
    
   
  
  
  More information
  
    
      Accepted/In Press date: 5 November 2014
 
    
      e-pub ahead of print date: 14 November 2014
 
    
      Published date: 15 December 2014
 
    
  
  
    
  
    
  
    
  
    
  
    
  
    
  
    
     
        Organisations:
        Optoelectronics Research Centre
      
    
  
    
  
  
        Identifiers
        Local EPrints ID: 386347
        URI: http://eprints.soton.ac.uk/id/eprint/386347
        
          
        
        
        
          ISSN: 0146-9592
        
        
          PURE UUID: a8dc34f8-edc7-4515-92b5-76a713f61dc4
        
  
    
        
          
            
          
        
    
        
          
        
    
        
          
        
    
        
          
            
              
            
          
        
    
        
          
        
    
        
          
        
    
  
  Catalogue record
  Date deposited: 25 Jan 2016 14:40
  Last modified: 15 Mar 2024 02:41
  Export record
  
  
   Altmetrics
   
   
  
 
 
  
    
    
      Contributors
      
          
          Author:
          
            
              
              
                Hyun-su Kim
              
              
            
            
          
        
      
          
          Author:
          
            
            
              Wei Li
            
          
        
      
          
          Author:
          
            
            
              Serhiy Danylyuk
            
          
        
      
        
      
          
          Author:
          
            
            
              Mario C. Marconi
            
          
        
      
          
          Author:
          
            
            
              Larissa Juschkin
            
          
        
      
      
      
    
  
   
  
    Download statistics
    
      Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.
      
      View more statistics