Coherent diffractive imaging with lower coherence laboratory sources
Coherent diffractive imaging with lower coherence laboratory sources
 
  Coherent Diffractive Imaging (CDI) also called "lens-less imaging" is an alternative to the classical brightfield, dark-field and phase contrast microscopy. CDI allows us to recover full information about the wave-field that passed sample ie. attenuation and relative phaseshift that can be used for estimation of the sample material properties
  
    
      Odstrčil, M.
      
        b297d3ec-ed42-4709-9f90-7af79d0644c7
      
     
  
    
      Baksh, P.
      
        578fea83-9a1c-4dd0-b3f6-66f5552f2344
      
     
  
    
      Frey, J.G.
      
        ba60c559-c4af-44f1-87e6-ce69819bf23f
      
     
  
    
      Brocklesby, W.S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
  
   
  
  
    
      2014
    
    
  
  
    
      Odstrčil, M.
      
        b297d3ec-ed42-4709-9f90-7af79d0644c7
      
     
  
    
      Baksh, P.
      
        578fea83-9a1c-4dd0-b3f6-66f5552f2344
      
     
  
    
      Frey, J.G.
      
        ba60c559-c4af-44f1-87e6-ce69819bf23f
      
     
  
    
      Brocklesby, W.S.
      
        c53ca2f6-db65-4e19-ad00-eebeb2e6de67
      
     
  
       
    
 
  
    
      
  
  
  
  
    Odstrčil, M., Baksh, P., Frey, J.G. and Brocklesby, W.S.
  
  
  
  
   
    (2014)
  
  
    
    Coherent diffractive imaging with lower coherence laboratory sources.
  
  
  
  
    
    
    
      
        
   
  
    Training School in Advanced X-Ray Spatial and Temporal Metrology, , Dubrovnik, Croatia.
   
        
        
        29 Sep - 01 Oct  2014.
      
    
  
  
  
  
  
  
  
  
   
  
    
      Record type:
      Conference or Workshop Item
      (Poster)
      
      
    
   
    
      
        
          Abstract
          Coherent Diffractive Imaging (CDI) also called "lens-less imaging" is an alternative to the classical brightfield, dark-field and phase contrast microscopy. CDI allows us to recover full information about the wave-field that passed sample ie. attenuation and relative phaseshift that can be used for estimation of the sample material properties
        
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  More information
  
    
      Published date: 2014
 
    
  
  
    
  
    
  
    
     
        Venue - Dates:
        Training School in Advanced X-Ray Spatial and Temporal Metrology, , Dubrovnik, Croatia, 2014-09-29 - 2014-10-01
      
    
  
    
  
    
  
    
  
    
     
        Organisations:
        Optoelectronics Research Centre, Chemistry
      
    
  
    
  
  
        Identifiers
        Local EPrints ID: 388040
        URI: http://eprints.soton.ac.uk/id/eprint/388040
        
        
        
        
          PURE UUID: b5c54d56-4f51-431b-bf13-5f49150aac3b
        
  
    
        
          
            
          
        
    
        
          
            
          
        
    
        
          
            
              
            
          
        
    
        
          
            
              
            
          
        
    
  
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  Date deposited: 19 Feb 2016 14:20
  Last modified: 23 Feb 2023 02:34
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      Contributors
      
          
          Author:
          
            
              
              
                M. Odstrčil
              
              
            
            
          
        
      
          
          Author:
          
            
              
              
                P. Baksh
              
              
            
            
          
        
      
        
      
        
      
      
      
    
  
   
  
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