Structural, dielectric and ferroelectric properties of (Bi,Na)TiO3–BaTiO3 system studied by high throughput screening
Structural, dielectric and ferroelectric properties of (Bi,Na)TiO3–BaTiO3 system studied by high throughput screening
Thin-film materials libraries of the Bi2O3–Na2O–TiO2–BaO system in a broad composition range have been deposited in ultra-high vacuum from elemental evaporation sources and an oxygen plasma source. A high throughput approach was used for systematic compositional and structural characterization and the screening of the dielectric and ferroelectric properties. The perovskite (Bi,Na)TiO3–BaTiO3 phase with a Ba concentration near the morphotropic phase boundary (ca. 6 at.%) exhibited a relative dielectric permittivity of 180, a loss tangent of 0.04 and remnant polarization of 19 ?C/cm2. Compared to published data, observed remnant polarization is close to that known for epitaxially grown films but higher than the values reported for polycrystalline films. The high throughput methodology and systematic nature of the study allowed us to establish the composition boundaries of the phase with optimal dielectric and ferroelectric characteristics.
lead-free piezoelectric, high-throughput screening, pvd, ferroelectric thin films, perovskite
108-114
Yakovlev, Sergey
5ab8a9ff-1c7b-4f01-b6bd-51320030cf88
Hayden, Brian E.
aea74f68-2264-4487-9d84-5b12ddbbb331
31 March 2016
Yakovlev, Sergey
5ab8a9ff-1c7b-4f01-b6bd-51320030cf88
Hayden, Brian E.
aea74f68-2264-4487-9d84-5b12ddbbb331
Yakovlev, Sergey and Hayden, Brian E.
(2016)
Structural, dielectric and ferroelectric properties of (Bi,Na)TiO3–BaTiO3 system studied by high throughput screening.
Thin Solid Films, 603, .
(doi:10.1016/j.tsf.2016.01.033).
Abstract
Thin-film materials libraries of the Bi2O3–Na2O–TiO2–BaO system in a broad composition range have been deposited in ultra-high vacuum from elemental evaporation sources and an oxygen plasma source. A high throughput approach was used for systematic compositional and structural characterization and the screening of the dielectric and ferroelectric properties. The perovskite (Bi,Na)TiO3–BaTiO3 phase with a Ba concentration near the morphotropic phase boundary (ca. 6 at.%) exhibited a relative dielectric permittivity of 180, a loss tangent of 0.04 and remnant polarization of 19 ?C/cm2. Compared to published data, observed remnant polarization is close to that known for epitaxially grown films but higher than the values reported for polycrystalline films. The high throughput methodology and systematic nature of the study allowed us to establish the composition boundaries of the phase with optimal dielectric and ferroelectric characteristics.
Text
TSF-D-15-01050_final_accepted.pdf
- Accepted Manuscript
More information
Accepted/In Press date: 15 January 2016
e-pub ahead of print date: 21 January 2016
Published date: 31 March 2016
Keywords:
lead-free piezoelectric, high-throughput screening, pvd, ferroelectric thin films, perovskite
Organisations:
Electrochemistry
Identifiers
Local EPrints ID: 390020
URI: http://eprints.soton.ac.uk/id/eprint/390020
ISSN: 0040-6090
PURE UUID: bc57334f-aa34-4bb2-b6e0-2678625e0f2a
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Date deposited: 17 Mar 2016 12:07
Last modified: 15 Mar 2024 02:36
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Author:
Sergey Yakovlev
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