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Effect of test conditions on the essential work of fracture in polyethylene terephthalate film

Effect of test conditions on the essential work of fracture in polyethylene terephthalate film
Effect of test conditions on the essential work of fracture in polyethylene terephthalate film
The tear resistance of polyethylene terephthalate film is characterized by the essential work of fracture method in mode I as a function of test speed and temperature. Attempts to extrapolate tearing resistance found by the method of essential work to commercial slitting processes are discussed. Limitations of the essential work of fracture method with regards to specimen size are evaluated. Based on the findings modifications to the test protocol are suggested.
deformation rate dependence, stress ductile fracture, polymeric films, toughness, parameters, sharpness
0022-2461
2861-2866
Light, Melissa E.
bebc77e0-2c8b-4e8e-a9ab-60849dd6b41a
Lesser, Alan J.
666690f3-b709-4329-abb3-794d332f1bc2
Light, Melissa E.
bebc77e0-2c8b-4e8e-a9ab-60849dd6b41a
Lesser, Alan J.
666690f3-b709-4329-abb3-794d332f1bc2

Light, Melissa E. and Lesser, Alan J. (2005) Effect of test conditions on the essential work of fracture in polyethylene terephthalate film. Journal of Materials Science, 40 (11), 2861-2866. (doi:10.1007/s10853-005-2430-9).

Record type: Article

Abstract

The tear resistance of polyethylene terephthalate film is characterized by the essential work of fracture method in mode I as a function of test speed and temperature. Attempts to extrapolate tearing resistance found by the method of essential work to commercial slitting processes are discussed. Limitations of the essential work of fracture method with regards to specimen size are evaluated. Based on the findings modifications to the test protocol are suggested.

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Published date: 2005
Keywords: deformation rate dependence, stress ductile fracture, polymeric films, toughness, parameters, sharpness

Identifiers

Local EPrints ID: 39098
URI: http://eprints.soton.ac.uk/id/eprint/39098
ISSN: 0022-2461
PURE UUID: b60d0f6c-0105-42f0-bb2d-d9a53c0d8e46

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Date deposited: 20 Jun 2006
Last modified: 15 Jul 2019 19:02

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Contributors

Author: Melissa E. Light
Author: Alan J. Lesser

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