Paper: "Comparative numerical studies of ion traps with integrated optical cavities"
Authors: Nina Podoliak, Hiroki Takahashi, Matthias Keller, Peter Horak

Data description:
Fig1a.csv, Fig1b.csv, Fig1c.csv, Fig1d.csv, Fig1e.csv: x,y-plane cross-section of the unperturbed trapping potentials for the (a) linear trap with blade shaped electrodes; (b) linear trap with wafer electrodes; (c) endcap trap; (d) stylus trap; (e) surface trap, respectively. Colorplots are shown in the insets of Fig.1.
Fig3.csv: Normalized trap depths in the x- and y-axis directions calculated for different ion traps and different optical cavity orientations as a function of cavity length. Plots are shown in Fig.3.
Fig3a.csv: x,z-plane cross-section of the disturbed trapping potential of the blade trap in the presence of the cavity oriented along the x- axis with a cavity length of 1 mm. Colorplot is shown in the inset of Fig.3a.
Fig4.csv: Normalized secular frequencies in the x- and y-axis directions calculated for different ion traps and different optical cavity orientations as a function of cavity length. Plots are shown in Fig.4.
Fig5a_1.csv, Fig5a_2.csv: (1) x,y- and (2) x,z-plane cross-section of the blade trap potential in the presence of the cavity with a cavity length of 1 mm, having mirrors oriented along the x- axis  and misaligned along the x-axis by 0.1 mm (longitudinal misalignment). Colorplots are shown in Fig.5a.
Fig5b_1.csv, Fig5b_2.csv: (1) x,y- and (2) y,z-plane cross-section of the blade trap potential in the presence of the cavity with a cavity length of 1 mm, having mirrors oriented along the x- axis  and misaligned along the y-axis by 0.1 mm (transverse misalignment). Colorplots are shown in Fig.5b.
Fig5c_1.csv, Fig5c_2.csv: (1) x,y- and (2) x,z-plane cross-section of the blade trap potential in the presence of the cavity with a cavity length of 1 mm, having mirrors oriented along the x- axis  and misaligned along the z-axis by 0.1 mm (skewed misalignment). Colorplots are shown in Fig.5c.
Fig6.csv: Anharmonicity of the blade trap potential due to a longitudinal misalignment of the cavity mirrors as a functions of cavity length. Plot is shown in Fig.6.
Fig7.csv: Electric field in the trap center generated by a constant surface charge of 10^{-6} Cm^{-2} on one of the cavity mirrors in the case of blade, wafer, endcap, stylus and surface trap designs. Plots are shown in Fig.7.
Fig8.csv: Trap depths and secular frequencies calculated for the blade linear trap with optical cavities with various mirror materials as specified in the 3rd row of the file. Plots are shown in Fig.8.

Data were obtained by numerical simulations using a finite element method in Comsol Multiphysics software (AC/DC module), see paper for more details.