The University of Southampton
University of Southampton Institutional Repository

The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator

NAWI, Illani Mohd, Halak, Basel and Zwolinski, Mark (2016) The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator At 21st IEEE European Test Symposium.

Record type: Conference or Workshop Item (Poster)

Full text not available from this repository.

More information

Published date: 27 May 2016
Venue - Dates: 21st IEEE European Test Symposium, 2016-05-27
Organisations: Faculty of Physical Sciences and Engineering

Identifiers

Local EPrints ID: 394523
URI: http://eprints.soton.ac.uk/id/eprint/394523
PURE UUID: 19ba5b10-6794-4102-8e47-62ce09b098e4
ORCID for Mark Zwolinski: ORCID iD orcid.org/0000-0002-2230-625X

Catalogue record

Date deposited: 17 May 2016 16:51
Last modified: 17 Jul 2017 19:00

Export record

Contributors

Author: Illani Mohd NAWI
Author: Basel Halak
Author: Mark Zwolinski ORCID iD

University divisions

Download statistics

Downloads from ePrints over the past year. Other digital versions may also be available to download e.g. from the publisher's website.

View more statistics

Atom RSS 1.0 RSS 2.0

Contact ePrints Soton: eprints@soton.ac.uk

ePrints Soton supports OAI 2.0 with a base URL of http://eprints.soton.ac.uk/cgi/oai2

This repository has been built using EPrints software, developed at the University of Southampton, but available to everyone to use.

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×