NBTI analysis on PUF-based differential architectures

Mispan, Mohd, Halak, Basel and Zwolinski, Mark (2016) NBTI analysis on PUF-based differential architectures. 22nd IEEE International Symposium on On-Line Testing and Robust System Design. (In Press)

Record type: Conference or Workshop Item (Paper)

Abstract

Silicon Physical Unclonable Functions (PUFs) have
emerged as novel cryptographic primitives with the ability to generate
unique chip identifiers and cryptographic keys by exploiting
intrinsic manufacturing process variations. “Two Choose One”
PUF (TCO-PUF) is a new PUF that has been recently proposed
to exploit the non-linear relationship of current and voltage in
the subthreshold operating region, hence increase the security
against modeling-based attacks. However, as CMOS technology
scales down, aging-induced Negative Bias Temperature Instability
(NBTI) is becoming more pronounced resulted in reliability issue
of PUF response. In this study, we investigate the robustness of
analogue and logic gates based differential architectures known
as TCO-PUF and Arbiter-PUF under influence of NBTI. In
comparison against NBTI, particularly RO-PUF and SRAMPUF,
the reliability of TCO-PUF and Arbiter-PUF are shown
to be more robust to aging-induced degradation. TCO-PUF and
Arbiter-PUF only degrade by about 4.5% and 2.41% respectively
after 10 years, while RO-PUFs and SRAM-PUFs degrade by
about 12.76% in ten years and 7% in 4.5 years, respectively.